A composite SystemC-UVM abstract optimal path selection verification architecture for complex designs

Universal Verification Methodology (UVM) architectures are highly trained for stimulus generation and verification of System-on-chip (SoC). The cross-functional and cross-platform interactive verification is the limitation of a sole UVM architecture. Sole UVM objects are not efficient to satisfy cro...

Full description

Saved in:
Bibliographic Details
Published inMicroelectronics and reliability Vol. 131; p. 114508
Main Authors Sharma, Gaurav, Bhargava, Lava, Kumar, V.
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 01.04.2022
Subjects
Online AccessGet full text
ISSN0026-2714
1872-941X
DOI10.1016/j.microrel.2022.114508

Cover

Abstract Universal Verification Methodology (UVM) architectures are highly trained for stimulus generation and verification of System-on-chip (SoC). The cross-functional and cross-platform interactive verification is the limitation of a sole UVM architecture. Sole UVM objects are not efficient to satisfy cross-functional compatibility requirements. A system C verification libraries have a mechanism of introspection. The data introspection is not capable of wide cross-platform use without reusable portable accurate TLM. So a UVM module requires a SystemC block to aim for the cross-functional working of verification. The work shows a composite UVM-SystemC methodology to rationally adhere to optimal test path selection among all test paths. The work presents SC-UVM (SystemC-UVM) architecture for cross-platform working facilitation. The learning methodology works to improvise coverage parameters with the optimization of coverage bins. The methodology earns a significant contribution for early verification by reducing the internal data processing and simulation time. The SystemC-UVM method outperforms the conventional SystemVerilog and Sole UVM verification techniques. The work declares the improvement of 5.26% in simulation time with 5.11% lesser data processing for database creation in front of the sole UVM verification architecture. •The testbench uses multi-tasking using the composite platform to ease the verification process for cross platform working.•Implementation of smart learning skill-based algorithm for optimal path selection to allow only one main scenario.•The composite SystemC-UVM testbench is for execution across IP level, block-level, and physical fabrication level.
AbstractList Universal Verification Methodology (UVM) architectures are highly trained for stimulus generation and verification of System-on-chip (SoC). The cross-functional and cross-platform interactive verification is the limitation of a sole UVM architecture. Sole UVM objects are not efficient to satisfy cross-functional compatibility requirements. A system C verification libraries have a mechanism of introspection. The data introspection is not capable of wide cross-platform use without reusable portable accurate TLM. So a UVM module requires a SystemC block to aim for the cross-functional working of verification. The work shows a composite UVM-SystemC methodology to rationally adhere to optimal test path selection among all test paths. The work presents SC-UVM (SystemC-UVM) architecture for cross-platform working facilitation. The learning methodology works to improvise coverage parameters with the optimization of coverage bins. The methodology earns a significant contribution for early verification by reducing the internal data processing and simulation time. The SystemC-UVM method outperforms the conventional SystemVerilog and Sole UVM verification techniques. The work declares the improvement of 5.26% in simulation time with 5.11% lesser data processing for database creation in front of the sole UVM verification architecture. •The testbench uses multi-tasking using the composite platform to ease the verification process for cross platform working.•Implementation of smart learning skill-based algorithm for optimal path selection to allow only one main scenario.•The composite SystemC-UVM testbench is for execution across IP level, block-level, and physical fabrication level.
ArticleNumber 114508
Author Sharma, Gaurav
Bhargava, Lava
Kumar, V.
Author_xml – sequence: 1
  givenname: Gaurav
  surname: Sharma
  fullname: Sharma, Gaurav
  email: gauravsharma@banasthali.in
  organization: Computer Science, Banasthali Vidyapith, Tonk 302044, India
– sequence: 2
  givenname: Lava
  surname: Bhargava
  fullname: Bhargava, Lava
  email: lavab@mnit.ac.in
  organization: MNIT, Jaipur 302017, India
– sequence: 3
  givenname: V.
  surname: Kumar
  fullname: Kumar, V.
  email: vinod.kumar_1@nxp.com
  organization: NXP Semiconductors, Noida, Uttar Pradesh 201301, India
BookMark eNqFkE9LwzAYh4NMcJt-BckXaM2bdG0FD47hP5h40Im3kKZvXEbbjCQO9-3tNr142Snk8Dy8v2dEBp3rkJBLYCkwyK9WaWu1dx6blDPOU4BswsoTMoSy4Ml1Bh8DMmSM5wkvIDsjoxBWjLGCAQwJTql27doFG5G-bkPEdpYs3p-pqkL0Skfq1tG2qqFrFZc0YIM6WtfRDXprrFb7j_J62Qt0_PJIjfN7Z4PftMZgP7twTk6NagJe_L5jsri_e5s9JvOXh6fZdJ5oATwmmivFsOKVqXKsBFScowHBRGEUasxFBSLTCJMMOfKiLgpRQymUKUtWc16KMbk5ePseIXg0Utu4P7HfYhsJTO6SyZX8SyZ3yeQhWY_n__C177f77XHw9gBiP25j0cugLXYaa-v7KrJ29pjiBw1Tj44
CitedBy_id crossref_primary_10_26634_jele_13_1_19344
Cites_doi 10.1016/j.vlsi.2020.11.013
10.1109/MDAT.2015.2427260
10.1109/TCAD.2019.2921319
10.1109/TCAD.2013.2282776
10.1109/MDAT.2016.2642898
10.1109/TCAD.2020.2974343
10.1109/ACCESS.2020.2999544
10.1166/jnn.2016.12252
10.1109/TCAD.2018.2848589
10.1109/TCAD.2020.3011039
ContentType Journal Article
Copyright 2022 Elsevier Ltd
Copyright_xml – notice: 2022 Elsevier Ltd
DBID AAYXX
CITATION
DOI 10.1016/j.microrel.2022.114508
DatabaseName CrossRef
DatabaseTitle CrossRef
DatabaseTitleList
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1872-941X
ExternalDocumentID 10_1016_j_microrel_2022_114508
S0026271422000324
GroupedDBID --K
--M
.DC
.~1
0R~
123
1B1
1~.
1~5
29M
4.4
457
4G.
5VS
7-5
71M
8P~
9JN
AABNK
AABXZ
AACTN
AAEDT
AAEDW
AAEPC
AAIAV
AAIKJ
AAKOC
AALRI
AAOAW
AAQFI
AAQXK
AAXUO
AAYFN
ABBOA
ABFNM
ABFRF
ABJNI
ABMAC
ABXDB
ABXRA
ABYKQ
ACDAQ
ACGFS
ACNNM
ACRLP
ACZNC
ADBBV
ADEZE
ADJOM
ADMUD
ADTZH
AEBSH
AECPX
AEFWE
AEKER
AENEX
AEZYN
AFKWA
AFRZQ
AFTJW
AGHFR
AGUBO
AGYEJ
AHHHB
AHJVU
AHZHX
AIALX
AIEXJ
AIKHN
AITUG
AJBFU
AJOXV
ALMA_UNASSIGNED_HOLDINGS
AMFUW
AMRAJ
AOUOD
AXJTR
AZFZN
BJAXD
BKOJK
BLXMC
CS3
DU5
EBS
EFJIC
EFLBG
EJD
EO8
EO9
EP2
EP3
F5P
FDB
FEDTE
FGOYB
FIRID
FNPLU
FYGXN
G-2
G-Q
GBLVA
GBOLZ
HVGLF
HZ~
IHE
J1W
JJJVA
KOM
LY7
M41
MAGPM
MO0
N9A
O-L
O9-
OAUVE
OZT
P-8
P-9
P2P
PC.
Q38
R2-
RIG
RNS
ROL
RPZ
RXW
SDF
SDG
SES
SET
SEW
SPC
SPCBC
SPD
SSM
SST
SSV
SSZ
T5K
T9H
TAE
UHS
UNMZH
WUQ
XOL
ZMT
~G-
AATTM
AAXKI
AAYWO
AAYXX
ABWVN
ACLOT
ACRPL
ACVFH
ADCNI
ADNMO
AEIPS
AEUPX
AFJKZ
AFPUW
AGQPQ
AIGII
AIIUN
AKBMS
AKRWK
AKYEP
ANKPU
APXCP
CITATION
EFKBS
~HD
ID FETCH-LOGICAL-c312t-c2aa0eb2bfb6eb31b22ef13037faece63b134ce154e2e27d773d183af880d2283
IEDL.DBID .~1
ISSN 0026-2714
IngestDate Wed Oct 01 05:17:16 EDT 2025
Thu Apr 24 22:52:19 EDT 2025
Fri Feb 23 02:40:32 EST 2024
IsPeerReviewed true
IsScholarly true
Keywords Coverage matrics
Stimulus
Cross-platform
Optimal path
SystemC-UVM
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c312t-c2aa0eb2bfb6eb31b22ef13037faece63b134ce154e2e27d773d183af880d2283
ParticipantIDs crossref_citationtrail_10_1016_j_microrel_2022_114508
crossref_primary_10_1016_j_microrel_2022_114508
elsevier_sciencedirect_doi_10_1016_j_microrel_2022_114508
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate April 2022
2022-04-00
PublicationDateYYYYMMDD 2022-04-01
PublicationDate_xml – month: 04
  year: 2022
  text: April 2022
PublicationDecade 2020
PublicationTitle Microelectronics and reliability
PublicationYear 2022
Publisher Elsevier Ltd
Publisher_xml – name: Elsevier Ltd
References Simon, Bhat, Rath, Kirscher, Maurer (bb0045) 2017
Anwar, Rashid, Azam, Naeem, Kashif, Butt (bb0170) 2020; 8
Yang (bb0060) 2014
Hany, Ismail, Kamal, Badran (bb0065) April 2013
Shin, Abdi, Gajski (bb0075) Jan 2004
Herman (bb0100) March 1998
Ludwig, Urdahl, Stoffel, Kunz (bb0010) 2020; 39
Shi, Nicolici (bb0035) 2016; 65
Kirchsteiger, Trummer, Steger, Weiss, Pistauer (bb0115) 2008
Sharma, Bhargava, Kumar (bb0110) 2021; 77
Woo, Cho, Park (bb0180) 2016; 16
Kim, Yun, Cho, Kim, Min (bb0070) Nov 2012
Hamed, Salah, Madian, Radwan (bb0190) Dec 2018
Berman (bb0080) April 2006; 23(4)
Caba, Rincn, Barba, de la Torre, Dondo, Lpez (bb0015) 2019
Cho, Kim, Jung, Kim, Li, Cho, Min, Choi (bb0055) Nov 2008; vol. 01
Trummer, Kirchsteiger, Steger, Wei, Pistauer, Dalton (bb0120) April 2010
Barnasconi, Dietrich, Einwich, Vrtler, Chaput, Lourat, Płcheux, Wang, Cuenot, Neumann, Nguyen, Lucas, Vaumorin (bb0135) Dec 2015; 32
Mischkalla, Mueller (bb0130) Sep. 2014
Bouhadiba, Moy, Maraninchi (bb0095) March 2013
Biswal, Singh, Singh (bb0030) 2017
Vineesh, Kumar, Shinde, Sharma, Fujita, Singh (bb0175) 2021; 40
Rashinkar, Paterson, Singh (bb0150) 2000
Saafan, El-Kharashi, Salem (bb0090) Dec 2016
Safieddine, Zaraket, Kanj, El-Zein, Roesner (bb0140) 2019; 38
Moretti (bb0160) Aug 2017; 34
Rashinkar, Paterson, Singh (bb0005) 2001
Andrade, Graf, Pfeifer, dos Santos (bb0195) 2020; 39
Zhaohui, Pierres, Shiqing, Fang, Royannez, See, Hoon (bb0105) Nov 2012
(bb0020) 2018
Salah, Abdelsalam (bb0155) 2013; 12
Silveira, Brito, Oliveira, Melcher (bb0125) 2012; 8
(bb0145) 2018
Li, Yin, Xu, Zhang, Xu (bb0165) 2021; 183
Syafalni, Surantha, Lam, Sutisna, Nagao, Wakasugi, Tongxin, Ochi, Tsuchiya (bb0025) 2016
Bo-Han, Yang, Huang (bb0040) 2014; 33
Li, Wang, Tang, Hu, Li, Gan, Feng, He (bb0050) 2020; vol. 9
Albin (bb0085) 2001
Georgoulopoulos, Giannou, Hatzopoulos (bb0185) July 2018
Kim (10.1016/j.microrel.2022.114508_bb0070) 2012
Mischkalla (10.1016/j.microrel.2022.114508_bb0130) 2014
Yang (10.1016/j.microrel.2022.114508_bb0060) 2014
Sharma (10.1016/j.microrel.2022.114508_bb0110) 2021; 77
Rashinkar (10.1016/j.microrel.2022.114508_bb0005) 2001
Herman (10.1016/j.microrel.2022.114508_bb0100) 1998
(10.1016/j.microrel.2022.114508_bb0020) 2018
Li (10.1016/j.microrel.2022.114508_bb0050) 2020; vol. 9
Saafan (10.1016/j.microrel.2022.114508_bb0090) 2016
Albin (10.1016/j.microrel.2022.114508_bb0085) 2001
Zhaohui (10.1016/j.microrel.2022.114508_bb0105) 2012
Syafalni (10.1016/j.microrel.2022.114508_bb0025) 2016
Caba (10.1016/j.microrel.2022.114508_bb0015) 2019
Vineesh (10.1016/j.microrel.2022.114508_bb0175) 2021; 40
Berman (10.1016/j.microrel.2022.114508_bb0080) 2006; 23(4)
Shi (10.1016/j.microrel.2022.114508_bb0035) 2016; 65
Trummer (10.1016/j.microrel.2022.114508_bb0120) 2010
Georgoulopoulos (10.1016/j.microrel.2022.114508_bb0185) 2018
Biswal (10.1016/j.microrel.2022.114508_bb0030) 2017
Salah (10.1016/j.microrel.2022.114508_bb0155) 2013; 12
Andrade (10.1016/j.microrel.2022.114508_bb0195) 2020; 39
Simon (10.1016/j.microrel.2022.114508_bb0045) 2017
Bouhadiba (10.1016/j.microrel.2022.114508_bb0095) 2013
Cho (10.1016/j.microrel.2022.114508_bb0055) 2008; vol. 01
Hany (10.1016/j.microrel.2022.114508_bb0065) 2013
Li (10.1016/j.microrel.2022.114508_bb0165) 2021; 183
Shin (10.1016/j.microrel.2022.114508_bb0075) 2004
Ludwig (10.1016/j.microrel.2022.114508_bb0010) 2020; 39
Kirchsteiger (10.1016/j.microrel.2022.114508_bb0115) 2008
Silveira (10.1016/j.microrel.2022.114508_bb0125) 2012; 8
Rashinkar (10.1016/j.microrel.2022.114508_bb0150) 2000
Anwar (10.1016/j.microrel.2022.114508_bb0170) 2020; 8
Bo-Han (10.1016/j.microrel.2022.114508_bb0040) 2014; 33
Woo (10.1016/j.microrel.2022.114508_bb0180) 2016; 16
Moretti (10.1016/j.microrel.2022.114508_bb0160) 2017; 34
Barnasconi (10.1016/j.microrel.2022.114508_bb0135) 2015; 32
Hamed (10.1016/j.microrel.2022.114508_bb0190) 2018
Safieddine (10.1016/j.microrel.2022.114508_bb0140) 2019; 38
References_xml – volume: 40
  start-page: 985
  year: 2021
  end-page: 998
  ident: bb0175
  article-title: Enhanced design debugging with assistance from guidance-based model checking
  publication-title: IEEE Trans.Comput.Aided Des.Integr.Circ.Syst.
– volume: 39
  start-page: 5295
  year: 2020
  end-page: 5303
  ident: bb0195
  article-title: A directed test generator for shared-memory verification of multicore chip designs
  publication-title: IEEE Trans.Comput.Aided Des.Integr.Circ.Syst.
– volume: 33
  start-page: 139
  year: 2014
  end-page: 152
  ident: bb0040
  article-title: A high-throughput and arbitrary-distribution pattern generator for the constrained random verification
  publication-title: IEEE Trans.Comput.Aided Des.Integr.Circ.Syst.
– start-page: 756
  year: Jan 2004
  end-page: 758
  ident: bb0075
  article-title: Automatic generation of bus functional models from transaction level models
  publication-title: ASP-DAC 2004: Asia and South Pacific Design Automation Conference 2004 (IEEE Cat. No.04EX753)
– start-page: 120
  year: March 1998
  end-page: 127
  ident: bb0100
  article-title: A strategy for C-based verification
  publication-title: Proceedings International Verilog HDL Conference and VHDL International Users Forum
– volume: 38
  start-page: 1529
  year: 2019
  end-page: 1542
  ident: bb0140
  article-title: Verification at rtl using separation of design concerns
  publication-title: IEEE Trans.Comput.Aided Des.Integr.Circ.Syst.
– start-page: 1
  year: 2018
  end-page: 1315
  ident: bb0020
  publication-title: IEEE standard for systemverilog–unified hardware design, specification, and verification language. IEEE Std 1800-2017 (Revision of IEEE Std 1800-2012)
– start-page: 1
  year: 2017
  end-page: 6
  ident: bb0045
  article-title: Coverage-driven mixed-signal verification of smart power ics in a uvm environment
  publication-title: 2017 22nd IEEE European Test Symposium (ETS)
– volume: 39
  start-page: 3093
  year: 2020
  end-page: 3106
  ident: bb0010
  article-title: Properties first-correct-by-construction rtl design in system-level design flows
  publication-title: IEEE Trans.Comput.Aided Des.Integr.Circ.Syst.
– volume: 23(4)
  start-page: 316
  year: April 2006
  end-page: 317
  ident: bb0080
  publication-title: Standards: The p1685 ip-xact ip Metadata Standard
– start-page: 8
  year: April 2010
  end-page: 11
  ident: bb0120
  article-title: Automated simulation-based verification of power requirements for systems-on-chips
  publication-title: 13th IEEE Symposium on Design And Diagnostics of Electronic Circuits and Systems
– start-page: 1
  year: April 2013
  end-page: 6
  ident: bb0065
  article-title: Approach for a unified functional verification flow
  publication-title: 2013 Saudi International Electronics, Communications and Photonics Conference
– start-page: 249
  year: 2001
  end-page: 252
  ident: bb0085
  article-title: Nuts and bolts of core and soc verification
  publication-title: Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232
– volume: vol. 9
  start-page: 395
  year: 2020
  end-page: 402
  ident: bb0050
  article-title: Design and verification of mcu chip bootloader
  publication-title: 2020 IEEE 9th Joint International Information Technology and Artificial Intelligence Conference (ITAIC)
– start-page: 1609
  year: March 2013
  ident: bb0095
  article-title: System-level modeling of energy in TLM for early validation of power and thermal management
  publication-title: Design, Automation, and Test in Europe (DATE)
– volume: 12
  start-page: 1
  year: 2013
  end-page: 4
  ident: bb0155
  publication-title: Ip Cores Design From Specifications to Production: Modeling, Verification, Optimization, And Protection
– start-page: 1
  year: 2019
  end-page: 7
  ident: bb0015
  article-title: Halib: hardware assertion library for on-board verification of fpga-based modules using hls
  publication-title: 2019 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and International Symposium of System-on-Chip (SoC)
– volume: vol. 01
  start-page: I-78
  year: Nov 2008
  end-page: I-81
  ident: bb0055
  article-title: Reusable platform design methodology for soc integration and verification
  publication-title: 2008 International SoC Design Conference
– start-page: 136
  year: Dec 2018
  end-page: 139
  ident: bb0190
  article-title: An automated lightweight UVM tool
  publication-title: 2018 30th International Conference on Microelectronics (ICM)
– year: 2001
  ident: bb0005
  article-title: System-on-a-chip Verification: Methodology And Techniques
– start-page: 405
  year: Nov 2012
  end-page: 407
  ident: bb0070
  article-title: How to automate millions lines of top-level uvm testbench and handle huge register classes
  publication-title: 2012 International SoC Design Conference (ISOCC)
– start-page: 982
  year: 2016
  end-page: 985
  ident: bb0025
  article-title: Assertion-based verification of industrial wlan system
  publication-title: 2016 IEEE International Symposium on Circuits and Systems (ISCAS)
– year: 2018
  ident: bb0145
  article-title: Uvm 1.2 (universal verification methodology)
– year: 2000
  ident: bb0150
  article-title: System-on-a-chip Verification: Methodology And Techniques
– volume: 8
  start-page: 2012
  year: 2012
  ident: bb0125
  article-title: Open systemc simulator with support for power gating design
  publication-title: Int.J.Reconfig.Comput.
– volume: 77
  start-page: 151
  year: 2021
  end-page: 166
  ident: bb0110
  article-title: Real-time automated register abstraction active power-aware electronic system level verification framework
  publication-title: Integration
– start-page: 1
  year: Sep. 2014
  end-page: 8
  ident: bb0130
  article-title: Advanced soc virtual prototyping for system-level power planning and validation
  publication-title: 2014 24th International Workshop on Power And Timing Modeling, Optimization And Simulation (PATMOS)
– start-page: 21
  year: 2017
  end-page: 24
  ident: bb0030
  article-title: Cache coherency controller verification ip using systemverilog assertions (sva) and universal verification methodologies (uvm)
  publication-title: 2017 11th International Conference on Intelligent Systems and Control (ISCO)
– start-page: 110
  year: Dec 2016
  end-page: 114
  ident: bb0090
  article-title: Soc connectivity specification extraction using incomplete rtl design: an approach for formal connectivity verification
  publication-title: 2016 11th International Design Test Symposium (IDT)
– start-page: 1
  year: 2014
  end-page: 3
  ident: bb0060
  article-title: Highly automated and efficient simulation environment with UVM
  publication-title: Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2014, Hsinchu, Taiwan, April 28-30, 2014
– volume: 34
  start-page: 69
  year: Aug 2017
  end-page: 75
  ident: bb0160
  article-title: Accelleras support for esl verification and stimulus reuse
  publication-title: IEEE Des.Test
– volume: 8
  start-page: 104407
  year: 2020
  end-page: 104431
  ident: bb0170
  article-title: A unified model-based framework for the simplified execution of static and dynamic assertion-based verification
  publication-title: IEEE Access
– start-page: 97
  year: July 2018
  end-page: 102
  ident: bb0185
  article-title: UVM-based verification of a mixed-signal design using systemverilog
  publication-title: 2018 28th International Symposium on Power And Timing Modeling, Optimization And Simulation (PATMOS)
– volume: 183
  start-page: 512
  year: 2021
  end-page: 518
  ident: bb0165
  article-title: Design and implementation of neural network computing framework on zynq soc embedded platform. Procedia Computer Science
  publication-title: Proceedings of the 10th International Conference of Information and Communication Technology
– volume: 16
  start-page: 5316
  year: 2016
  end-page: 5319
  ident: bb0180
  article-title: Universal verification methodology based register test automation flow
  publication-title: J. Nanosci. Nanotechnol.
– start-page: 175
  year: Nov 2012
  end-page: 178
  ident: bb0105
  article-title: Practical and efficient SOC verification flow by reusing ip testcase and testbench
  publication-title: 2012 International SoC Design Conference (ISOCC)
– start-page: 33
  year: 2008
  end-page: 36
  ident: bb0115
  article-title: Automatic verification plan generation to speed up soc verification
  publication-title: Proc. of IEEE Nordic Circuits and Systems Conference (NORCAS) and International Symposium of System-on-Chip (SoC) (NORCHIP)
– volume: 65
  start-page: 3676
  year: 2016
  end-page: 3686
  ident: bb0035
  article-title: Generating cyclic-random sequences in a constrained space for in-system validation
  publication-title: IEEE Trans. Comput.
– volume: 32
  start-page: 76
  year: Dec 2015
  end-page: 86
  ident: bb0135
  article-title: Uvm-systemc-ams framework for system-level verification and validation of automotive use cases
  publication-title: IEEE Des.Test
– start-page: 756
  year: 2004
  ident: 10.1016/j.microrel.2022.114508_bb0075
  article-title: Automatic generation of bus functional models from transaction level models
– start-page: 175
  year: 2012
  ident: 10.1016/j.microrel.2022.114508_bb0105
  article-title: Practical and efficient SOC verification flow by reusing ip testcase and testbench
– volume: 77
  start-page: 151
  year: 2021
  ident: 10.1016/j.microrel.2022.114508_bb0110
  article-title: Real-time automated register abstraction active power-aware electronic system level verification framework
  publication-title: Integration
  doi: 10.1016/j.vlsi.2020.11.013
– volume: 12
  start-page: 1
  year: 2013
  ident: 10.1016/j.microrel.2022.114508_bb0155
– volume: 32
  start-page: 76
  issue: 6
  year: 2015
  ident: 10.1016/j.microrel.2022.114508_bb0135
  article-title: Uvm-systemc-ams framework for system-level verification and validation of automotive use cases
  publication-title: IEEE Des.Test
  doi: 10.1109/MDAT.2015.2427260
– volume: 39
  start-page: 3093
  issue: 10
  year: 2020
  ident: 10.1016/j.microrel.2022.114508_bb0010
  article-title: Properties first-correct-by-construction rtl design in system-level design flows
  publication-title: IEEE Trans.Comput.Aided Des.Integr.Circ.Syst.
  doi: 10.1109/TCAD.2019.2921319
– start-page: 97
  year: 2018
  ident: 10.1016/j.microrel.2022.114508_bb0185
  article-title: UVM-based verification of a mixed-signal design using systemverilog
– year: 2001
  ident: 10.1016/j.microrel.2022.114508_bb0005
– volume: 33
  start-page: 139
  issue: 1
  year: 2014
  ident: 10.1016/j.microrel.2022.114508_bb0040
  article-title: A high-throughput and arbitrary-distribution pattern generator for the constrained random verification
  publication-title: IEEE Trans.Comput.Aided Des.Integr.Circ.Syst.
  doi: 10.1109/TCAD.2013.2282776
– start-page: 1
  year: 2018
  ident: 10.1016/j.microrel.2022.114508_bb0020
– start-page: 136
  year: 2018
  ident: 10.1016/j.microrel.2022.114508_bb0190
  article-title: An automated lightweight UVM tool
– start-page: 21
  year: 2017
  ident: 10.1016/j.microrel.2022.114508_bb0030
  article-title: Cache coherency controller verification ip using systemverilog assertions (sva) and universal verification methodologies (uvm)
– volume: 65
  start-page: 3676
  issue: 12
  year: 2016
  ident: 10.1016/j.microrel.2022.114508_bb0035
  article-title: Generating cyclic-random sequences in a constrained space for in-system validation
  publication-title: IEEE Trans. Comput.
– start-page: 982
  year: 2016
  ident: 10.1016/j.microrel.2022.114508_bb0025
  article-title: Assertion-based verification of industrial wlan system
– start-page: 110
  year: 2016
  ident: 10.1016/j.microrel.2022.114508_bb0090
  article-title: Soc connectivity specification extraction using incomplete rtl design: an approach for formal connectivity verification
– volume: 34
  start-page: 69
  issue: 4
  year: 2017
  ident: 10.1016/j.microrel.2022.114508_bb0160
  article-title: Accelleras support for esl verification and stimulus reuse
  publication-title: IEEE Des.Test
  doi: 10.1109/MDAT.2016.2642898
– start-page: 249
  year: 2001
  ident: 10.1016/j.microrel.2022.114508_bb0085
  article-title: Nuts and bolts of core and soc verification
– volume: 39
  start-page: 5295
  issue: 12
  year: 2020
  ident: 10.1016/j.microrel.2022.114508_bb0195
  article-title: A directed test generator for shared-memory verification of multicore chip designs
  publication-title: IEEE Trans.Comput.Aided Des.Integr.Circ.Syst.
  doi: 10.1109/TCAD.2020.2974343
– start-page: 1
  year: 2013
  ident: 10.1016/j.microrel.2022.114508_bb0065
  article-title: Approach for a unified functional verification flow
– volume: 8
  start-page: 2012
  issue: 06
  year: 2012
  ident: 10.1016/j.microrel.2022.114508_bb0125
  article-title: Open systemc simulator with support for power gating design
  publication-title: Int.J.Reconfig.Comput.
– start-page: 33
  year: 2008
  ident: 10.1016/j.microrel.2022.114508_bb0115
  article-title: Automatic verification plan generation to speed up soc verification
– start-page: 8
  year: 2010
  ident: 10.1016/j.microrel.2022.114508_bb0120
  article-title: Automated simulation-based verification of power requirements for systems-on-chips
– volume: 8
  start-page: 104407
  year: 2020
  ident: 10.1016/j.microrel.2022.114508_bb0170
  article-title: A unified model-based framework for the simplified execution of static and dynamic assertion-based verification
  publication-title: IEEE Access
  doi: 10.1109/ACCESS.2020.2999544
– start-page: 1
  year: 2014
  ident: 10.1016/j.microrel.2022.114508_bb0130
  article-title: Advanced soc virtual prototyping for system-level power planning and validation
– volume: 23(4)
  start-page: 316
  year: 2006
  ident: 10.1016/j.microrel.2022.114508_bb0080
– start-page: 120
  year: 1998
  ident: 10.1016/j.microrel.2022.114508_bb0100
  article-title: A strategy for C-based verification
– start-page: 1
  year: 2019
  ident: 10.1016/j.microrel.2022.114508_bb0015
  article-title: Halib: hardware assertion library for on-board verification of fpga-based modules using hls
– start-page: 1
  year: 2014
  ident: 10.1016/j.microrel.2022.114508_bb0060
  article-title: Highly automated and efficient simulation environment with UVM
– volume: vol. 01
  start-page: I-78
  year: 2008
  ident: 10.1016/j.microrel.2022.114508_bb0055
  article-title: Reusable platform design methodology for soc integration and verification
– start-page: 1609
  year: 2013
  ident: 10.1016/j.microrel.2022.114508_bb0095
  article-title: System-level modeling of energy in TLM for early validation of power and thermal management
– volume: 16
  start-page: 5316
  year: 2016
  ident: 10.1016/j.microrel.2022.114508_bb0180
  article-title: Universal verification methodology based register test automation flow
  publication-title: J. Nanosci. Nanotechnol.
  doi: 10.1166/jnn.2016.12252
– year: 2000
  ident: 10.1016/j.microrel.2022.114508_bb0150
– volume: 183
  start-page: 512
  year: 2021
  ident: 10.1016/j.microrel.2022.114508_bb0165
  article-title: Design and implementation of neural network computing framework on zynq soc embedded platform. Procedia Computer Science
– volume: vol. 9
  start-page: 395
  year: 2020
  ident: 10.1016/j.microrel.2022.114508_bb0050
  article-title: Design and verification of mcu chip bootloader
– start-page: 1
  year: 2017
  ident: 10.1016/j.microrel.2022.114508_bb0045
  article-title: Coverage-driven mixed-signal verification of smart power ics in a uvm environment
– start-page: 405
  year: 2012
  ident: 10.1016/j.microrel.2022.114508_bb0070
  article-title: How to automate millions lines of top-level uvm testbench and handle huge register classes
– volume: 38
  start-page: 1529
  issue: 8
  year: 2019
  ident: 10.1016/j.microrel.2022.114508_bb0140
  article-title: Verification at rtl using separation of design concerns
  publication-title: IEEE Trans.Comput.Aided Des.Integr.Circ.Syst.
  doi: 10.1109/TCAD.2018.2848589
– volume: 40
  start-page: 985
  issue: 5
  year: 2021
  ident: 10.1016/j.microrel.2022.114508_bb0175
  article-title: Enhanced design debugging with assistance from guidance-based model checking
  publication-title: IEEE Trans.Comput.Aided Des.Integr.Circ.Syst.
  doi: 10.1109/TCAD.2020.3011039
SSID ssj0007011
Score 2.3228195
Snippet Universal Verification Methodology (UVM) architectures are highly trained for stimulus generation and verification of System-on-chip (SoC). The...
SourceID crossref
elsevier
SourceType Enrichment Source
Index Database
Publisher
StartPage 114508
SubjectTerms Coverage matrics
Cross-platform
Optimal path
Stimulus
SystemC-UVM
Title A composite SystemC-UVM abstract optimal path selection verification architecture for complex designs
URI https://dx.doi.org/10.1016/j.microrel.2022.114508
Volume 131
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVESC
  databaseName: Baden-Württemberg Complete Freedom Collection (Elsevier)
  customDbUrl:
  eissn: 1872-941X
  dateEnd: 99991231
  omitProxy: true
  ssIdentifier: ssj0007011
  issn: 0026-2714
  databaseCode: GBLVA
  dateStart: 20110101
  isFulltext: true
  titleUrlDefault: https://www.sciencedirect.com
  providerName: Elsevier
– providerCode: PRVESC
  databaseName: Elsevier SD Complete Freedom Collection [SCCMFC]
  customDbUrl:
  eissn: 1872-941X
  dateEnd: 99991231
  omitProxy: true
  ssIdentifier: ssj0007011
  issn: 0026-2714
  databaseCode: ACRLP
  dateStart: 19950101
  isFulltext: true
  titleUrlDefault: https://www.sciencedirect.com
  providerName: Elsevier
– providerCode: PRVESC
  databaseName: Elsevier SD Freedom Collection Journals [SCFCJ]
  customDbUrl:
  eissn: 1872-941X
  dateEnd: 99991231
  omitProxy: true
  ssIdentifier: ssj0007011
  issn: 0026-2714
  databaseCode: AIKHN
  dateStart: 19950101
  isFulltext: true
  titleUrlDefault: https://www.sciencedirect.com
  providerName: Elsevier
– providerCode: PRVESC
  databaseName: ScienceDirect (Elsevier)
  customDbUrl:
  eissn: 1872-941X
  dateEnd: 99991231
  omitProxy: true
  ssIdentifier: ssj0007011
  issn: 0026-2714
  databaseCode: .~1
  dateStart: 19950101
  isFulltext: true
  titleUrlDefault: https://www.sciencedirect.com
  providerName: Elsevier
– providerCode: PRVLSH
  databaseName: Elsevier Journals
  customDbUrl:
  mediaType: online
  eissn: 1872-941X
  dateEnd: 99991231
  omitProxy: true
  ssIdentifier: ssj0007011
  issn: 0026-2714
  databaseCode: AKRWK
  dateStart: 19620101
  isFulltext: true
  providerName: Library Specific Holdings
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV1La8MwDDalu2yHsSd7Fh92dds4jt0cS1npNtrTOnoLsaNAS1-0Hey03z4pjy2DQQ87xkQmSLYsxZ_0MfYgtXPGhZibgAKhrPFEKDuJCAKMFTpWuzSgAufhSA_G6nkSTGqsV9bCEKyy8P25T8-8dTHSKrTZWk-nVOMrtTT0D4MCe0k9QZUyxGLQ_PyBeZi2l7PmSS3o7UqV8Ky5INDbBugKQkpqmxsQzeRfB1Tl0OmfsOMiWuTd_INOWQ2WZ-yo0kPwnEGXEyycsFfA8_7jPTF-G_LY0l8Mt-Mr9AoLnIXIh_k2471BY3BcwwQTyizDq_cJHOPYbM45fPAkQ3hsL9i4__jaG4iCO0E435M74WQctzFrtqnVmC97VkpI6bwyaQwOtG89XznAAAokSJMY4ye4u-MU93NCLXEuWX25WsIV4wqtSTTpsTGgUov5hdNh6vuQ2FjiyDULSoVFrmgsTvwW86hEkM2iUtERKTrKFX3NWt9y67y1xl6JsLRH9GuRROj_98je_EP2lh3SUw7YuWP13eYd7jEW2dlGttga7KD79DIYfQE0OeFT
linkProvider Elsevier
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV1LTwIxEG4QD-rB-Iz47MFrge0-yh4JkaACJzDcNtvubALhFVgTT_52Z_aha2LCwWu702xm2nm038ww9ig9Y5TxMTYBB4SjlSV82YqE66Kv0NKeiV1KcB4Mvd7YeZm4kwrrFLkwBKvMdX-m01NtnY80cm421tMp5fhKTyq6wyDHXjp7bN9xpaIIrP75g_NQTStrmyc9QZ-X0oRn9QWh3jZAbxBSUt1cl_pM_mWhSlane8KOc3eRt7M_OmUVWJ6xo1IRwXMGbU64cAJfAc8KkHfE-G3AQ03XGCbhK1QLC1yFug_zbdr4BqXBcRMTTigVDS8_KHB0ZNM15_DBoxTisb1g4-7TqNMTefMEYWxLJsLIMGxi2Kxj7WHAbGkpISaDpeIQDHi2tmzHAHpQIEGqSCk7wuMdxnigI6qJc8mqy9USrhh3UJzUJz1UCpxYY4BhPD-2bYh0KHGkxtyCYYHJK4tTg4t5UEDIZkHB6IAYHWSMrrHGN906q62xk8Iv5BH82iUBGoAdtNf_oH1gB73RoB_0n4evN-yQZjL0zi2rJpt3uEPHJNH36cb7AoGe4ug
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=A+composite+SystemC-UVM+abstract+optimal+path+selection+verification+architecture+for+complex+designs&rft.jtitle=Microelectronics+and+reliability&rft.au=Sharma%2C+Gaurav&rft.au=Bhargava%2C+Lava&rft.au=Kumar%2C+V.&rft.date=2022-04-01&rft.pub=Elsevier+Ltd&rft.issn=0026-2714&rft.eissn=1872-941X&rft.volume=131&rft_id=info:doi/10.1016%2Fj.microrel.2022.114508&rft.externalDocID=S0026271422000324
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0026-2714&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0026-2714&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0026-2714&client=summon