The temperature dependence of single-event transients in 90-nm CMOS dual-well and triple-well NMOSFETs - 李达维 秦军瑞 陈书明 (Chinese physics B, 2013)
Keywords: CMOS; Computer aided design; Drains; Metal oxide semiconductors; Metal oxides; NMOS场效应晶体管; Semiconductors; Temperature dependence; Three dimensional; 单事件; 双阱; 温度依赖性; 瞬变; 纳米; 金属氧化物半导体场效应晶体管