On-current Modeling of 70-nm PMOSFETs Dependent on Hot-carrier Stress Bias Conditions - Choi, Woo Young; Lim, In Eui; Jhon, Heesauk; Yoon, Gyuhan (Journal of semiconductor technology and science, 2018)
Keywords: 전기공학; PMOSFET; modeling; bias dependency; HEIP; reliability