A New Joint Training Method for Facial Expression Recognition with Inconsistently Annotated and Imbalanced Data

Facial expression recognition (FER) plays a crucial role in various applications, including human–computer interaction and affective computing. However, the joint training of an FER network with multiple datasets is a promising strategy to enhance its performance. Nevertheless, widespread annotation...

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Published inElectronics (Basel) Vol. 13; no. 19; p. 3891
Main Authors Chen, Tao, Zhang, Dong, Lee, Dah-Jye
Format Journal Article
LanguageEnglish
Published Basel MDPI AG 01.10.2024
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ISSN2079-9292
2079-9292
DOI10.3390/electronics13193891

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Summary:Facial expression recognition (FER) plays a crucial role in various applications, including human–computer interaction and affective computing. However, the joint training of an FER network with multiple datasets is a promising strategy to enhance its performance. Nevertheless, widespread annotation inconsistencies and class imbalances among FER datasets pose significant challenges to this approach. This paper proposes a new multi-dataset joint training method, Sample Selection and Paired Augmentation Joint Training (SSPA-JT), to address these challenges. SSPA-JT models annotation inconsistency as a label noise problem and selects clean samples from auxiliary datasets to expand the overall dataset size while maintaining consistent annotation standards. Additionally, a dynamic matching algorithm is developed to pair clean samples of the tail class with noisy samples, which enriches the tail classes with diverse background information. Experimental results demonstrate that SSPA-JT achieved superior or comparable performance compared with the existing methods by addressing both annotation inconsistencies and class imbalance during multi-dataset joint training. It achieved state-of-the-art performance on RAF-DB and CAER-S datasets with accuracies of 92.44% and 98.22%, respectively, reflecting improvements of 0.2% and 3.65% over existing methods.
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ISSN:2079-9292
2079-9292
DOI:10.3390/electronics13193891