Kwon, K., Kim, S., Bien, F., & Kim, J. J. (2015). A Fully-Differential Correlated Doubling Sampling Readout Circuit for Mutual-capacitance Touch Screens. Journal of semiconductor technology and science, 15(3), 349-355. https://doi.org/10.5573/JSTS.2015.15.3.349
Chicago Style (17th ed.) CitationKwon, Kihyun, Sung-Woo Kim, Franklin Bien, and Jae Joon Kim. "A Fully-Differential Correlated Doubling Sampling Readout Circuit for Mutual-capacitance Touch Screens." Journal of Semiconductor Technology and Science 15, no. 3 (2015): 349-355. https://doi.org/10.5573/JSTS.2015.15.3.349.
MLA (9th ed.) CitationKwon, Kihyun, et al. "A Fully-Differential Correlated Doubling Sampling Readout Circuit for Mutual-capacitance Touch Screens." Journal of Semiconductor Technology and Science, vol. 15, no. 3, 2015, pp. 349-355, https://doi.org/10.5573/JSTS.2015.15.3.349.