D'Agostino, G., Oelze, M., Vogl, J., Ghestem, J., Lafaurie, N., Klein, O., . . . Noireaux, J. (2024). Development and application of reference and routine analytical methods providing SI-traceable results for the determination of technology-critical elements in PCB from WEEE. Journal of analytical atomic spectrometry, 39(11), 289-2823. https://doi.org/10.1039/d4ja00235k
Chicago Style (17th ed.) CitationD'Agostino, Giancarlo, et al. "Development and Application of Reference and Routine Analytical Methods Providing SI-traceable Results for the Determination of Technology-critical Elements in PCB from WEEE." Journal of Analytical Atomic Spectrometry 39, no. 11 (2024): 289-2823. https://doi.org/10.1039/d4ja00235k.
MLA (9th ed.) CitationD'Agostino, Giancarlo, et al. "Development and Application of Reference and Routine Analytical Methods Providing SI-traceable Results for the Determination of Technology-critical Elements in PCB from WEEE." Journal of Analytical Atomic Spectrometry, vol. 39, no. 11, 2024, pp. 289-2823, https://doi.org/10.1039/d4ja00235k.