APA (7th ed.) Citation

Nouketcha, F. L., Green, R., & Lelis, A. J. (2020). Effects of Pulsed and DC Body-Diode Current Stress on the Stability of 1200-V SiC MOSFET I-V Characteristics. Materials science forum, 1004, 1. https://doi.org/10.4028/www.scientific.net/MSF.1004.1027

Chicago Style (17th ed.) Citation

Nouketcha, Franklin L., Ronald Green, and Aivars J. Lelis. "Effects of Pulsed and DC Body-Diode Current Stress on the Stability of 1200-V SiC MOSFET I-V Characteristics." Materials Science Forum 1004 (2020): 1. https://doi.org/10.4028/www.scientific.net/MSF.1004.1027.

MLA (9th ed.) Citation

Nouketcha, Franklin L., et al. "Effects of Pulsed and DC Body-Diode Current Stress on the Stability of 1200-V SiC MOSFET I-V Characteristics." Materials Science Forum, vol. 1004, 2020, p. 1, https://doi.org/10.4028/www.scientific.net/MSF.1004.1027.