Preparation of a silicon micro-strip nuclear radiation detector by a two-step annealing process
The annealing process for boron implantation is a crucial step during large size nuclear radiation detector fabrication. It can reduce the lattice defects and the projection straggling. A two-step annealing process for boron implantation was developed instead of a one-step annealing process, and the...
Saved in:
| Published in | Chinese physics C Vol. 35; no. 7; pp. 635 - 637 |
|---|---|
| Main Author | |
| Format | Journal Article |
| Language | English |
| Published |
01.07.2011
|
| Subjects | |
| Online Access | Get full text |
| ISSN | 1674-1137 0254-3052 |
| DOI | 10.1088/1674-1137/35/7/007 |
Cover
| Abstract | The annealing process for boron implantation is a crucial step during large size nuclear radiation detector fabrication. It can reduce the lattice defects and the projection straggling. A two-step annealing process for boron implantation was developed instead of a one-step annealing process, and the reverse body resistance of a silicon micro-strip detector was significantly increased, which means that the performance of the detector was improved. |
|---|---|
| AbstractList | The annealing process for boron implantation is a crucial step during large size nuclear radiation detector fabrication. It can reduce the lattice defects and the projection straggling. A two-step annealing process for boron implantation was developed instead of a one-step annealing process, and the reverse body resistance of a silicon micro-strip detector was significantly increased, which means that the performance of the detector was improved. |
| Author | 李海霞 李占奎 王方聪 王柱生 王秀华 李春艳 |
| AuthorAffiliation | Institute of Modern Physics, Chinese Academy of Science, Lanzhou 730000, China Institute of Microelectronics, School of Physical Science and Technology, Lanzhou University, Lanzhou 730000, China |
| Author_xml | – sequence: 1 fullname: 李海霞 李占奎 王方聪 王柱生 王秀华 李春艳 |
| BookMark | eNp9kE1PwyAYgImZidv0D3iqNy91UKDQo1n8SpboQc8EKExMRztgMfv3Urfs4MHTG5Ln4c37zMDE994AcI3gHYKcL1DNSIkQZgtMF2wBITsDU1hRUmJIqwmYnoALMIvxC8KaZG8KxFswgwwyud4XvS1kEV3ndH5snA59GVNwQ-F3ujMyFEG27oC2Jhmd-lCofXbS90iaoZDeG9k5vy6G0GsT4yU4t7KL5uo45-Dj8eF9-VyuXp9elverUmNYp9IirhBscIUUJXVjKVaNwky1rbKEW1NZKTE1rIakUpKxFmFdMyYJR8wiovAc3B7-zXu3OxOT2LioTddJb_pdFIhUDaecVjij_IDm-2IMxgrt0u9VKUjXCQTF2FSMycSYTGAqmMhNs1r9UYfgNjLs_5dujtJn79fbHOdkYY4x5JDjH44_h3w |
| CitedBy_id | crossref_primary_10_1088_1674_1137_39_6_066005 |
| ContentType | Journal Article |
| DBID | 2RA 92L CQIGP ~WA AAYXX CITATION 7U5 8FD H8D L7M |
| DOI | 10.1088/1674-1137/35/7/007 |
| DatabaseName | 维普期刊资源整合服务平台 中文科技期刊数据库-CALIS站点 维普中文期刊数据库 中文科技期刊数据库- 镜像站点 CrossRef Solid State and Superconductivity Abstracts Technology Research Database Aerospace Database Advanced Technologies Database with Aerospace |
| DatabaseTitle | CrossRef Aerospace Database Solid State and Superconductivity Abstracts Technology Research Database Advanced Technologies Database with Aerospace |
| DatabaseTitleList | Aerospace Database |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Physics |
| DocumentTitleAlternate | Preparation of a silicon micro-strip nuclear radiation detector by a two-step annealing process |
| EISSN | 0254-3052 |
| EndPage | 637 |
| ExternalDocumentID | 10_1088_1674_1137_35_7_007 38330808 |
| GroupedDBID | 02O 1JI 1WK 29B 2B. 2C. 2RA 4.4 5B3 5GY 5VR 5VS 7.M 92E 92I 92L 92Q 93N AAGCD AAGID AAJIO AAJKP AALHV AATNI ABCXL ABHWH ABJNI ACAFW ACGFS ACHIP AENEX AFUIB AFYNE AIBLX AKPSB ALMA_UNASSIGNED_HOLDINGS ATQHT BBWZM CCEZO CCVFK CEBXE CHBEP CJUJL CQIGP CRLBU CW9 DU5 EBS EDWGO EJD EPQRW EQZZN ER. FA0 FEDTE HVGLF IJHAN IOP IZVLO JCGBZ KNG KOT M45 N5L NT- NT. OK1 PJBAE Q02 RIN RNS ROL RPA RW3 SY9 TCJ TGP W28 ~WA -SA -SC -S~ AAYXX ADEQX AEINN AERVB AOAED CAJEA CAJEC CITATION Q-- U1G U5K U5M 7U5 8FD H8D L7M |
| ID | FETCH-LOGICAL-c306t-f18b109321b5469f53b9b37bddbf48fe2faa35e76042ba77d13c677a4817f14b3 |
| ISSN | 1674-1137 |
| IngestDate | Thu Sep 04 17:36:00 EDT 2025 Thu Apr 24 23:00:28 EDT 2025 Wed Oct 01 03:43:14 EDT 2025 Wed Feb 14 09:50:30 EST 2024 |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 7 |
| Language | English |
| LinkModel | OpenURL |
| MergedId | FETCHMERGED-LOGICAL-c306t-f18b109321b5469f53b9b37bddbf48fe2faa35e76042ba77d13c677a4817f14b3 |
| Notes | The annealing process for boron implantation is a crucial step during large size nuclear radiation detector fabrication. It can reduce the lattice defects and the projection straggling. A two-step annealing process for boron implantation was developed instead of a one-step annealing process, and the reverse body resistance of a silicon micro-strip detector was significantly increased, which means that the performance of the detector was improved. 11-5641/O4 nuclear radiation detector, two-step annealing, reverse body resistance LI Hai-Xia LI Zhan-Kui WANG Fang-Cong WANG Zhu-Sheng WANG Xiu-Hua LI Chun-Yan( 1 Institute of Modern Physics, Chinese Academy of Science, Lanzhou 730000, China;2 Institute of Microelectronics, School of Physical Science and Technology, Lanzhou University, Lanzhou 730000, China) ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
| PQID | 1429858523 |
| PQPubID | 23500 |
| PageCount | 3 |
| ParticipantIDs | proquest_miscellaneous_1429858523 crossref_citationtrail_10_1088_1674_1137_35_7_007 crossref_primary_10_1088_1674_1137_35_7_007 chongqing_primary_38330808 |
| ProviderPackageCode | CITATION AAYXX |
| PublicationCentury | 2000 |
| PublicationDate | 2011-07-01 |
| PublicationDateYYYYMMDD | 2011-07-01 |
| PublicationDate_xml | – month: 07 year: 2011 text: 2011-07-01 day: 01 |
| PublicationDecade | 2010 |
| PublicationTitle | Chinese physics C |
| PublicationTitleAlternate | Chinese Physica C |
| PublicationYear | 2011 |
| References | Sands T (8) 2003; 554 Santucci S (2) 2003; 554 Nobili D (4) 2003; 554 O' Sullivan B J (1) 2003; 554 Briantseve T A (3) 2003; 554 Seidel T E (9) 2003; 554 Kim Y (7) 2003; 554 Ajmera A C (10) 2003; 554 Tamura M M (5) 2003; 554 Schreutelkamp R J (6) 2003; 554 |
| References_xml | – volume: 554 start-page: 143 year: 2003 ident: 7 publication-title: J. Electron. Mater. – volume: 554 start-page: 54 issn: 0022-3093 year: 2003 ident: 2 publication-title: J. Non-Crys. Solids – volume: 554 start-page: 251 issn: 0168-583X year: 2003 ident: 9 publication-title: Nucl. Instrum. Methods – volume: 554 start-page: 21 issn: 0169-4332 year: 2003 ident: 3 publication-title: Appl. Surf. Sci. – volume: 554 start-page: 813 year: 2003 ident: 10 publication-title: Appl. Phys. Lett. J. – volume: 554 start-page: 1484 year: 2003 ident: 4 publication-title: J. Appl. Phys. – volume: 554 start-page: 141 issn: 0920-2307 year: 2003 ident: 5 publication-title: Mater. Sci. Rep. – volume: 554 start-page: 3811 year: 2003 ident: 1 publication-title: J. Appl. Phys. – volume: 554 start-page: 275 issn: 0920-2307 year: 2003 ident: 6 publication-title: Mater. Sci. Rep. – volume: 554 start-page: 337 issn: 0168-583X year: 2003 ident: 8 publication-title: Nucl. Instrum. Methods |
| SSID | ssj0064088 |
| Score | 1.8264685 |
| Snippet | The annealing process for boron implantation is a crucial step during large size nuclear radiation detector fabrication. It can reduce the lattice defects and... |
| SourceID | proquest crossref chongqing |
| SourceType | Aggregation Database Enrichment Source Index Database Publisher |
| StartPage | 635 |
| SubjectTerms | Annealing Boron Crystal defects Detectors Implantation Nuclear radiation Projection Silicon 两步退火 制备 大尺寸 晶格缺陷 核辐射探测器 硅微条探测器 硼离子注入 退火工艺 |
| Title | Preparation of a silicon micro-strip nuclear radiation detector by a two-step annealing process |
| URI | http://lib.cqvip.com/qk/92043A/201107/38330808.html https://www.proquest.com/docview/1429858523 |
| Volume | 35 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| journalDatabaseRights | – providerCode: PRVIOP databaseName: IOP Science Platform customDbUrl: eissn: 0254-3052 dateEnd: 99991231 omitProxy: false ssIdentifier: ssj0064088 issn: 1674-1137 databaseCode: IOP dateStart: 20080101 isFulltext: true titleUrlDefault: https://iopscience.iop.org/ providerName: IOP Publishing |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3dixMxEA_1RPBF_MTeqUTwbYk1m93N7qMcHucHWvAOii8hyWZp4dzWdouc-Mc7s5tst3KK50u6TbJTyPw6X8lMCHmBJga3ToNvkmcM9HXOTAENmPJlyW1sQTDjaYuP2el58m6Wzkajn8Psksa8tD-uzCv5H65CH_AVs2SvwdmeKHTAM_AXWuAwtP_E4-nadaW7O6NPR5vFBXC2jr7iMTuGV3KsohorFut1tMYqBO3U0jVtrB5NTx0133GmW0UaRK722elt9sDQcMV7tt3G-UjIZhdc_dBde60XbLbQ-50YjGbvt4td0L4TLCfwyY6XXmcOBr7Mt-zz3PmBchdclSEW0YnPTCaM866MS5CvXTkSjyM5EJaZH3H-m7xSpIMYxOhCoAzPAsthyPZgpNypsbB1_5t2688ctrvtea6QkkJKSqQKN9_lDXIzBp2AF3-8_TQNejwD9LaJlOGXfcoV9E76volIJ1ggSmJpjjks3Dfg0r6Js6_hW7Pl7C654_0N-roDzz0ycvV9cmvacfEBUQMI0WVFNfUQogMIUQ8h2kOIBghRcwnvBAjRHkLUQ-ghOT95c3Z8yvydG8yC89iwiucGK4zF3KRJVlSpMIUR0pSlqZK8cnGltUidzEDYGy1lyYXNpNRJzmXFEyMekYN6WbvHhCZYOvJVagtwehMtCu2SHBwIW1qRZtplY3LYL5ladbVVlMiFACcmHxMe1lBZX60eL025UH_m45hE_TuB3t9mPw-sUSBScZ9M12653YA3HBe4XR6Lw2tRPCK3d3-KJ-SgWW_dUzBZG_OsRdYvdlSP3Q |
| linkProvider | IOP Publishing |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Preparation+of+a+silicon+micro-strip+nuclear+radiation+detector+by+a+two-step+annealing+process&rft.jtitle=Chinese+physics+C&rft.au=Li%2C+Hai-Xia&rft.au=Li%2C+Zhan-Kui&rft.au=Wang%2C+Fang-Cong&rft.au=Wang%2C+Zhu-Sheng&rft.date=2011-07-01&rft.issn=1674-1137&rft.volume=35&rft.issue=7&rft.spage=635&rft.epage=637&rft_id=info:doi/10.1088%2F1674-1137%2F35%2F7%2F007&rft.externalDBID=n%2Fa&rft.externalDocID=10_1088_1674_1137_35_7_007 |
| thumbnail_s | http://utb.summon.serialssolutions.com/2.0.0/image/custom?url=http%3A%2F%2Fimage.cqvip.com%2Fvip1000%2Fqk%2F92043A%2F92043A.jpg |