Study on the influence of X-ray tube spectral distribution on the analysis of bulk samples and thin films: Fundamental parameters method and theoretical coefficient algorithms

• Published in: Spectrochimica acta. Part B: Atomic spectroscopy Vol. 63; no. 11; pp. 1297 - 1302
• Main Author: Sitko, Rafał
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.11.2008
• Subjects: Fundamental parameter; Matrix effect; Theoretical algorithm; X-ray fluorescence spectrometry; X-ray tube spectrum; X-ray fluorescence spectrometry; Matrix effect; X-ray tube spectrum; Theoretical algorithm; Fundamental parameter
• ISSN: 0584-8547; 1873-3565
• DOI: 10.1016/j.sab.2008.09.010

Knowledge of X-ray tube spectral distribution is necessary in theoretical methods of matrix correction, i.e. in both fundamental parameter (FP) methods and theoretical influence coefficient algorithms. Thus, the influence of X-ray tube distribution on the accuracy of the analysis of thin films and bulk samples is presented. The calculations are performed using experimental X-ray tube spectra taken from the literature and theoretical X-ray tube spectra evaluated by three different algorithms proposed by Pella et al. (X-Ray Spectrom. 14 (1985) 125–135), Ebel (X-Ray Spectrom. 28 (1999) 255–266), and Finkelshtein and Pavlova (X-Ray Spectrom. 28 (1999) 27–32). In this study, Fe–Cr–Ni system is selected as an example and the calculations are performed for X-ray tubes commonly applied in X-ray fluorescence analysis (XRF), i.e., Cr, Mo, Rh and W. The influence of X-ray tube spectra on FP analysis is evaluated when quantification is performed using various types of calibration samples. FP analysis of bulk samples is performed using pure-element bulk standards and multielement bulk standards similar to the analyzed material, whereas for FP analysis of thin films, the bulk and thin pure-element standards are used. For the evaluation of the influence of X-ray tube spectra on XRF analysis performed by theoretical influence coefficient methods, two algorithms for bulk samples are selected, i.e. Claisse–Quintin (Can. Spectrosc. 12 (1967) 129–134) and COLA algorithms (G.R. Lachance, Paper Presented at the International Conference on Industrial Inorganic Elemental Analysis, Metz, France, June 3, 1981) and two algorithms (constant and linear coefficients) for thin films recently proposed by Sitko (X-Ray Spectrom. 37 (2008) 265–272).