Bias-Dependent Contact Resistance Characterization of Carbon Nanotube FETs - Pacheco-Sanchez, Anibal; Claus, Martin (IEEE transactions on nanotechnology, 2020)
Keywords: Bias; Carbon nanotube field effect transistors (CNTFET); Carbon nanotubes; CNTFETs; Computer simulation; Contact resistance; Data mining; Data models; Field effect transistors; Integrated circuit modeling; Logic gates; Schottky barrier; Schottky barriers; Technology assessment