APA (7th ed.) Citation

Pacheco-Sanchez, A., & Claus, M. (2020). Bias-Dependent Contact Resistance Characterization of Carbon Nanotube FETs. IEEE transactions on nanotechnology, 19, 47-51. https://doi.org/10.1109/TNANO.2019.2958677

Chicago Style (17th ed.) Citation

Pacheco-Sanchez, Anibal, and Martin Claus. "Bias-Dependent Contact Resistance Characterization of Carbon Nanotube FETs." IEEE Transactions on Nanotechnology 19 (2020): 47-51. https://doi.org/10.1109/TNANO.2019.2958677.

MLA (9th ed.) Citation

Pacheco-Sanchez, Anibal, and Martin Claus. "Bias-Dependent Contact Resistance Characterization of Carbon Nanotube FETs." IEEE Transactions on Nanotechnology, vol. 19, 2020, pp. 47-51, https://doi.org/10.1109/TNANO.2019.2958677.