Reliability Evaluation and Failure Behavior Modeling of IMS Considering Functional and Physical Isolation Effects - Chen, Ying; Wang, Ze; Ma, Qichao; Liang, Kun (IEEE/ASME transactions on mechatronics, 2019)
Keywords: Artificial intelligence; Collision avoidance; Degradation; Design optimization; Failure analysis; Failure behavior; failure isolation; Failure mechanisms; Frequency modulation; functional dependence (FDEP); intelligent mechatronic system (IMS); Mechatronics; Modelling; Reliability analysis; Reliability engineering; reliability modeling; Stress