APA (7th ed.) Citation

Chen, Y., Wang, Z., Ma, Q., & Liang, K. (2019). Reliability Evaluation and Failure Behavior Modeling of IMS Considering Functional and Physical Isolation Effects. IEEE/ASME transactions on mechatronics, 24(6), 2441-2452. https://doi.org/10.1109/TMECH.2019.2950893

Chicago Style (17th ed.) Citation

Chen, Ying, Ze Wang, Qichao Ma, and Kun Liang. "Reliability Evaluation and Failure Behavior Modeling of IMS Considering Functional and Physical Isolation Effects." IEEE/ASME Transactions on Mechatronics 24, no. 6 (2019): 2441-2452. https://doi.org/10.1109/TMECH.2019.2950893.

MLA (9th ed.) Citation

Chen, Ying, et al. "Reliability Evaluation and Failure Behavior Modeling of IMS Considering Functional and Physical Isolation Effects." IEEE/ASME Transactions on Mechatronics, vol. 24, no. 6, 2019, pp. 2441-2452, https://doi.org/10.1109/TMECH.2019.2950893.