Multi-Coding ECC Algorithm Based on 3D Charge Trap NAND Flash Hot Region Cell Prediction - Jiang, Yiyang; Wang, Qi; Li, Qianhui; Huo, Zongliang (IEEE communications letters, 2020)
Keywords: 3D-CT NAND flash; Algorithms; Coding; Data models; Degradation; Encoding; Error analysis; Error correction codes; hot region cell redistribution; Multi-Coding ECC; RBER balance; Silicon; Three dimensional models; Three-dimensional displays; Threshold voltage; threshold voltage shift model