A Fast Hill Climbing Algorithm for Defect and Variation Tolerant Logic Mapping of Nano-Crossbar Arrays - Peker, Furkan; Altun, Mustafa (IEEE transactions on multi-scale computing systems, 2018)
Keywords: Algorithm design and analysis; Algorithms; Arrays; Climbing; Computer simulation; defect tolerance; Defects; Delay; Delays; Field effect transistors; Mapping; Nano-crossbar arrays; Optimization; Programmable logic arrays; Runtime; Self-assembly; Simulation; variation tolerance; worst-case delay optimization