APA (7th ed.) Citation

Peker, F., & Altun, M. (2018). A Fast Hill Climbing Algorithm for Defect and Variation Tolerant Logic Mapping of Nano-Crossbar Arrays. IEEE transactions on multi-scale computing systems, 4(4), 522-532. https://doi.org/10.1109/TMSCS.2018.2829518

Chicago Style (17th ed.) Citation

Peker, Furkan, and Mustafa Altun. "A Fast Hill Climbing Algorithm for Defect and Variation Tolerant Logic Mapping of Nano-Crossbar Arrays." IEEE Transactions on Multi-scale Computing Systems 4, no. 4 (2018): 522-532. https://doi.org/10.1109/TMSCS.2018.2829518.

MLA (9th ed.) Citation

Peker, Furkan, and Mustafa Altun. "A Fast Hill Climbing Algorithm for Defect and Variation Tolerant Logic Mapping of Nano-Crossbar Arrays." IEEE Transactions on Multi-scale Computing Systems, vol. 4, no. 4, 2018, pp. 522-532, https://doi.org/10.1109/TMSCS.2018.2829518.