Digital Twin-Based Cyber-Attack Detection Framework for Cyber-Physical Manufacturing Systems - Balta, Efe C.; Pease, Michael; Moyne, James; Barton, Kira; Tilbury, Dawn M. (IEEE transactions on automation science and engineering, 2024)
Keywords: Anomalies; Anomaly detection; Closed loops; Context; Control systems; Controllers; Cyber-physical systems; Cyberattack; Cybersecurity; data analysis; Decision analysis; Decision making; Digital twins; Extensibility; fault detection; Industrial electronics; Industrial Internet of Things; intelligent automation; Machine learning; Manufacturing; manufacturing automation; model checking; Monitoring; Predictive control; Process control; Scalability; security; Three dimensional printing; Transient response