Determination of the Bit Error Rate Due to Thermal Noise Using JoSIM Superconducting Circuit Simulator and the Monte Carlo Method - Hall, Tessa; Delport, Johannes A.; Fourie, Coenrad J. (IEEE transactions on applied superconductivity, 2023)
Keywords: Bit error rate; Circuit Design; Electronic Design Automation; Integrated circuit modeling; Junctions; Libraries; Monte Carlo methods; Monte Carlo simulation; Resistors; RSFQ; Simulation; Simulation Software; Simulators; Superconductivity; Thermal noise