APA (7th ed.) Citation

Schulze, C., Mengozzi, M., Gibiino, G. P., Angelotti, A. M., Florian, C., Santarelli, A., . . . Bengtsson, O. (2024). A VNA-Based Wideband Measurement System for Large-Signal Characterization of Multiport Circuits. IEEE transactions on microwave theory and techniques, 72(1), 1-10. https://doi.org/10.1109/TMTT.2023.3325105

Chicago Style (17th ed.) Citation

Schulze, Christoph, Mattia Mengozzi, Gian Piero Gibiino, Alberto Maria Angelotti, Corrado Florian, Alberto Santarelli, Wolfgang Heinrich, and Olof Bengtsson. "A VNA-Based Wideband Measurement System for Large-Signal Characterization of Multiport Circuits." IEEE Transactions on Microwave Theory and Techniques 72, no. 1 (2024): 1-10. https://doi.org/10.1109/TMTT.2023.3325105.

MLA (9th ed.) Citation

Schulze, Christoph, et al. "A VNA-Based Wideband Measurement System for Large-Signal Characterization of Multiport Circuits." IEEE Transactions on Microwave Theory and Techniques, vol. 72, no. 1, 2024, pp. 1-10, https://doi.org/10.1109/TMTT.2023.3325105.