A CT 2-2 MASH ΔΣ ADC With Multi-Rate LMS-Based Background Calibration and Input-Insensitive Quantization-Error Extraction - Fukazawa, Mitsuya; Oshima, Takashi; Fujiwara, Masaki; Tateyama, Katsuki; Ochi, Atsushi; Alsubaie, Raed; Matsui, Tetsuo (IEEE journal of solid-state circuits, 2021)
Keywords: Algorithms; Analog to digital conversion; Analog to digital converters; Analog-to-digital converter (ADC); background calibration; Calibration; cascades; CMOS; continuous time (CT); Delays; delta–sigma (ΔΣ); Distortion; Errors; Figure of merit; Finite impulse response filters; Frequency variation; Inspection; least mean square (LMS); Measurement; Modulation; multi-rate (MR); Multi-stage noise shaping; multistage noise-shaping (MASH); Noise; Noise levels; Pseudorandom; quantizer delay; Transfer functions