ARBSA: Adaptive Range-Based Simulated Annealing for FPGA Placement

Placement has always been the most time-consuming part of the field programmable gate array (FPGA) compilation flow. Conventional simulated annealing has been unable to keep pace with ever increasing sizes of designs and FPGA chip resources. Without utilizing information of the circuit topology, it...

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Published inIEEE transactions on computer-aided design of integrated circuits and systems Vol. 38; no. 12; pp. 2330 - 2342
Main Authors Yuan, Junqi, Chen, Jialing, Wang, Lingli, Zhou, Xuegong, Xia, Yinshui, Hu, Jianping
Format Journal Article
LanguageEnglish
Published New York IEEE 01.12.2019
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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ISSN0278-0070
1937-4151
DOI10.1109/TCAD.2018.2878180

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Summary:Placement has always been the most time-consuming part of the field programmable gate array (FPGA) compilation flow. Conventional simulated annealing has been unable to keep pace with ever increasing sizes of designs and FPGA chip resources. Without utilizing information of the circuit topology, it relies on large amounts of random swap operations, which are time-costly. This paper proposes an adaptive range-based algorithm to improve the behavior of swap operations and limit the swap distances by introducing the concept of range-limiting strategy for nets. It avoids unnecessary design space exploration, and thus can converge to near-optimal solutions much more quickly. The experimental results are based on the Titan benchmarks, which contain 4K to 30K blocks, including logic array blocks, inputs and outputs, digital signal processors, and random access memories. This approach achieves <inline-formula> <tex-math notation="LaTeX">2.82\boldsymbol \times </tex-math></inline-formula> speed up, 4.8% reduction on wire length, 4.1% improvement on critical path compared with the SA from VTR with wire length-driven optimization, and <inline-formula> <tex-math notation="LaTeX">1.78\boldsymbol \times </tex-math></inline-formula> speed up, 10% reduction on wire length, 2% reduction on critical path with path timing-driven optimization. It also manifests better scalability on larger benchmarks.
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ISSN:0278-0070
1937-4151
DOI:10.1109/TCAD.2018.2878180