APA (7th ed.) Citation

Chen, Y., Schilling, M., von Hartrott, P., Nasrabadi, H. B., Skrotzki, B., & Olbricht, J. (2022). Ontopanel: A Tool for Domain Experts Facilitating Visual Ontology Development and Mapping for FAIR Data Sharing in Materials Testing. Integrating materials and manufacturing innovation, 11(4), 545-556. https://doi.org/10.1007/s40192-022-00279-y

Chicago Style (17th ed.) Citation

Chen, Yue, Markus Schilling, Philipp von Hartrott, Hossein Beygi Nasrabadi, Birgit Skrotzki, and Jürgen Olbricht. "Ontopanel: A Tool for Domain Experts Facilitating Visual Ontology Development and Mapping for FAIR Data Sharing in Materials Testing." Integrating Materials and Manufacturing Innovation 11, no. 4 (2022): 545-556. https://doi.org/10.1007/s40192-022-00279-y.

MLA (9th ed.) Citation

Chen, Yue, et al. "Ontopanel: A Tool for Domain Experts Facilitating Visual Ontology Development and Mapping for FAIR Data Sharing in Materials Testing." Integrating Materials and Manufacturing Innovation, vol. 11, no. 4, 2022, pp. 545-556, https://doi.org/10.1007/s40192-022-00279-y.