APA (7th ed.) Citation

Eslahi, H., Albahrani, S. A., Mahajan, D., & Khandelwal, S. (2020). An Analytical Model for Hot Carrier Induced Long-Term Degradation in Power Amplifiers. IEEE transactions on computer-aided design of integrated circuits and systems, 39(10), 2000-2005. https://doi.org/10.1109/TCAD.2019.2952554

Chicago Style (17th ed.) Citation

Eslahi, Hossein, Sayed Ali Albahrani, Dhawal Mahajan, and Sourabh Khandelwal. "An Analytical Model for Hot Carrier Induced Long-Term Degradation in Power Amplifiers." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems 39, no. 10 (2020): 2000-2005. https://doi.org/10.1109/TCAD.2019.2952554.

MLA (9th ed.) Citation

Eslahi, Hossein, et al. "An Analytical Model for Hot Carrier Induced Long-Term Degradation in Power Amplifiers." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, vol. 39, no. 10, 2020, pp. 2000-2005, https://doi.org/10.1109/TCAD.2019.2952554.