APA (7th ed.) Citation

Lee, K., Liu, C., & Wu, C. (2022). A Dynamic-Key Based Secure Scan Architecture for Manufacturing and In-Field IC Testing. IEEE transactions on emerging topics in computing, 10(1), 373-385. https://doi.org/10.1109/TETC.2020.3021820

Chicago Style (17th ed.) Citation

Lee, Kuen-Jong, Ching-An Liu, and Chia-Chi Wu. "A Dynamic-Key Based Secure Scan Architecture for Manufacturing and In-Field IC Testing." IEEE Transactions on Emerging Topics in Computing 10, no. 1 (2022): 373-385. https://doi.org/10.1109/TETC.2020.3021820.

MLA (9th ed.) Citation

Lee, Kuen-Jong, et al. "A Dynamic-Key Based Secure Scan Architecture for Manufacturing and In-Field IC Testing." IEEE Transactions on Emerging Topics in Computing, vol. 10, no. 1, 2022, pp. 373-385, https://doi.org/10.1109/TETC.2020.3021820.