Modeling of the Signal Transmission of a Coaxial Connector With a Degraded Dielectric Layer in a Humid Environment
Radio frequency coaxial connectors are key components in circuits for signal transmission and directly influence the stability of communication systems. It is well known that connectors operating in harsh environments for extended periods are subject to physical degradation, which may lead to deteri...
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          | Published in | IEEE transactions on dielectrics and electrical insulation Vol. 29; no. 4; pp. 1522 - 1529 | 
|---|---|
| Main Authors | , , , , , | 
| Format | Journal Article | 
| Language | English | 
| Published | 
        New York
          IEEE
    
        01.08.2022
     The Institute of Electrical and Electronics Engineers, Inc. (IEEE)  | 
| Subjects | |
| Online Access | Get full text | 
| ISSN | 1070-9878 1558-4135  | 
| DOI | 10.1109/TDEI.2022.3188055 | 
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| Abstract | Radio frequency coaxial connectors are key components in circuits for signal transmission and directly influence the stability of communication systems. It is well known that connectors operating in harsh environments for extended periods are subject to physical degradation, which may lead to deterioration of signal integrity and overall communication quality. However, little work has been done with regard to connector dielectric degradation in humid environments. In this current work, the specific effects of connector dielectric degradation in humid environments on signal transmission are studied by theoretical and experimental analysis. Both a 3-D electromagnetic field model and an equivalent circuit model for connectors before and after degradation are developed in order to evaluate signal reflection and transmission loss. The results of these two models are compared and show good agreement. In addition, based on the material properties of the connector dielectric, the equivalent dielectric layer of a degraded connector is considered to consist of a double-layer dielectric structure composed of polytetrafluoroethylene (PTFE) and a layer of water film. The equivalent dielectric constant and equivalent loss tangent of the double-layer dielectric structure are calculated and analyzed. A corresponding equivalent circuit is developed consisting of an impedance network with resistance and capacitance elements in parallel. Experiment tests are conducted to validate the electromagnetic field model and the circuit model results. The results of this research provide a better understanding of the electrical characteristics of degraded connectors in humid environments and theoretical support for engineering applications. | 
    
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| AbstractList | Radio frequency coaxial connectors are key components in circuits for signal transmission and directly influence the stability of communication systems. It is well known that connectors operating in harsh environments for extended periods are subject to physical degradation, which may lead to deterioration of signal integrity and overall communication quality. However, little work has been done with regard to connector dielectric degradation in humid environments. In this current work, the specific effects of connector dielectric degradation in humid environments on signal transmission are studied by theoretical and experimental analysis. Both a 3-D electromagnetic field model and an equivalent circuit model for connectors before and after degradation are developed in order to evaluate signal reflection and transmission loss. The results of these two models are compared and show good agreement. In addition, based on the material properties of the connector dielectric, the equivalent dielectric layer of a degraded connector is considered to consist of a double-layer dielectric structure composed of polytetrafluoroethylene (PTFE) and a layer of water film. The equivalent dielectric constant and equivalent loss tangent of the double-layer dielectric structure are calculated and analyzed. A corresponding equivalent circuit is developed consisting of an impedance network with resistance and capacitance elements in parallel. Experiment tests are conducted to validate the electromagnetic field model and the circuit model results. The results of this research provide a better understanding of the electrical characteristics of degraded connectors in humid environments and theoretical support for engineering applications. | 
    
| Author | Bilal, Hafiz M. Wang, Wenjia Flowers, George T. Bi, Lingyu Wang, Ziren Gao, Jinchun  | 
    
| Author_xml | – sequence: 1 givenname: Wenjia surname: Wang fullname: Wang, Wenjia organization: Beijing Key Laboratory of Work Safety Intelligent Monitoring, School of Electronic Engineering, Beijing University of Posts and Telecommunications, Beijing, China – sequence: 2 givenname: Jinchun orcidid: 0000-0002-1280-4212 surname: Gao fullname: Gao, Jinchun email: gjc@bupt.edu.cn organization: Beijing Key Laboratory of Work Safety Intelligent Monitoring, School of Electronic Engineering, Beijing University of Posts and Telecommunications, Beijing, China – sequence: 3 givenname: George T. surname: Flowers fullname: Flowers, George T. organization: Center for Advanced Vehicle and Extreme Environment Electronics (CAVE3), Auburn University, Auburn, AL, USA – sequence: 4 givenname: Ziren surname: Wang fullname: Wang, Ziren organization: China Telecommunication Technology Labs, China Academy of Information and Communications Technology, Beijing, China – sequence: 5 givenname: Lingyu surname: Bi fullname: Bi, Lingyu organization: Beijing Key Laboratory of Work Safety Intelligent Monitoring, School of Electronic Engineering, Beijing University of Posts and Telecommunications, Beijing, China – sequence: 6 givenname: Hafiz M. surname: Bilal fullname: Bilal, Hafiz M. organization: Beijing Key Laboratory of Work Safety Intelligent Monitoring, School of Electronic Engineering, Beijing University of Posts and Telecommunications, Beijing, China  | 
    
| BookMark | eNp9kD1PwzAQhi1UJNrCD0AslphT_BEn9ojaQisVMVDEGDmx07pK7GK7iP57ErViYGC6k55773TPCAyssxqAW4wmGCPxsJ7NlxOCCJlQzDli7AIMMWM8STFlg65HOUoEz_kVGIWwQwinjGRD4F-c0o2xG-hqGLcavpmNlQ1ce2lDa0IwzvZIwqmT36YjU2etrqLz8MPEbQdmeuOl0grOjG464k0FV_KoPTS2w4tDaxSc2y_jnW21jdfgspZN0DfnOgbvT_P1dJGsXp-X08dVUhFBY4IZVRWmGcuQklxTlZOSSyoIUwrXZZkrXOapYixVGREMiVxUiFKOlUIiUxkdg_vT3r13nwcdYrFzB989FwqSCc4xTXk_hU9TlXcheF0Xe29a6Y8FRkWvtujVFr3a4qy2y-R_MpWJMnaqopem-Td5d0oarfXvJcExQxzRH9USh70 | 
    
| CODEN | ITDIES | 
    
| CitedBy_id | crossref_primary_10_1109_TEMC_2024_3422076 crossref_primary_10_1088_1402_4896_ada2bf crossref_primary_10_1016_j_measurement_2025_117254 crossref_primary_10_1016_j_ceramint_2023_12_401  | 
    
| Cites_doi | 10.1109/TMTT.2013.2295769 10.1109/ICSD.2010.5568220 10.1109/TCPMT.2019.2920918 10.1002/mmce.22271 10.1109/TMTT.2018.2838147 10.1587/transele.E100.C.1052 10.1109/TIM.2020.3047194 10.1109/EMCSI.2018.8495293 10.1109/TCPMT.2019.2931890 10.1109/OPTIM.2012.6231788 10.1109/ICPADM.2015.7295341 10.1007/s11664-019-07651-3 10.1109/33.76514 10.1109/TCPMT.2017.2688023 10.1109/TCPMT.2017.2776405 10.1109/SPCE50045.2020.9296167  | 
    
| ContentType | Journal Article | 
    
| Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2022 | 
    
| Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2022 | 
    
| DBID | 97E RIA RIE AAYXX CITATION 7SP 8FD L7M  | 
    
| DOI | 10.1109/TDEI.2022.3188055 | 
    
| DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005–Present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Electronic Library (IEL) CrossRef Electronics & Communications Abstracts Technology Research Database Advanced Technologies Database with Aerospace  | 
    
| DatabaseTitle | CrossRef Technology Research Database Advanced Technologies Database with Aerospace Electronics & Communications Abstracts  | 
    
| DatabaseTitleList | Technology Research Database | 
    
| Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher  | 
    
| DeliveryMethod | fulltext_linktorsrc | 
    
| Discipline | Engineering Physics  | 
    
| EISSN | 1558-4135 | 
    
| EndPage | 1529 | 
    
| ExternalDocumentID | 10_1109_TDEI_2022_3188055 9815080  | 
    
| Genre | orig-research | 
    
| GrantInformation_xml | – fundername: National Natural Science Foundation of China grantid: 51877010 funderid: 10.13039/501100001809 – fundername: NSF Center for Advanced Vehicle and Extreme Environment Electronics (CAVE3) at Auburn University funderid: 10.13039/100007579  | 
    
| GroupedDBID | -~X 0R~ 29I 4.4 5GY 5VS 6IK 97E AAJGR AARMG AASAJ AAWTH ABAZT ABQJQ ABVLG ACGFO ACGFS ACIWK AENEX AETIX AGQYO AGSQL AHBIQ AI. AIBXA AKJIK AKQYR ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD F5P HZ~ H~9 ICLAB IFIPE IFJZH IPLJI JAVBF LAI M43 O9- OCL P2P RIA RIE RNS RXW TAE TAF TN5 VH1 AAYXX CITATION 7SP 8FD L7M  | 
    
| ID | FETCH-LOGICAL-c293t-153dc136560da8e3d72b8a3925dd1fbb7d1b74d554d62950979c03381dd096d63 | 
    
| IEDL.DBID | RIE | 
    
| ISSN | 1070-9878 | 
    
| IngestDate | Mon Jun 30 08:18:28 EDT 2025 Wed Oct 01 01:11:08 EDT 2025 Thu Apr 24 23:06:23 EDT 2025 Wed Aug 27 02:23:32 EDT 2025  | 
    
| IsPeerReviewed | true | 
    
| IsScholarly | true | 
    
| Issue | 4 | 
    
| Language | English | 
    
| License | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html https://doi.org/10.15223/policy-029 https://doi.org/10.15223/policy-037  | 
    
| LinkModel | DirectLink | 
    
| MergedId | FETCHMERGED-LOGICAL-c293t-153dc136560da8e3d72b8a3925dd1fbb7d1b74d554d62950979c03381dd096d63 | 
    
| Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14  | 
    
| ORCID | 0000-0002-1280-4212 | 
    
| PQID | 2698813486 | 
    
| PQPubID | 75745 | 
    
| PageCount | 8 | 
    
| ParticipantIDs | crossref_primary_10_1109_TDEI_2022_3188055 crossref_citationtrail_10_1109_TDEI_2022_3188055 ieee_primary_9815080 proquest_journals_2698813486  | 
    
| ProviderPackageCode | CITATION AAYXX  | 
    
| PublicationCentury | 2000 | 
    
| PublicationDate | 2022-Aug. 2022-8-00 20220801  | 
    
| PublicationDateYYYYMMDD | 2022-08-01 | 
    
| PublicationDate_xml | – month: 08 year: 2022 text: 2022-Aug.  | 
    
| PublicationDecade | 2020 | 
    
| PublicationPlace | New York | 
    
| PublicationPlace_xml | – name: New York | 
    
| PublicationTitle | IEEE transactions on dielectrics and electrical insulation | 
    
| PublicationTitleAbbrev | T-DEI | 
    
| PublicationYear | 2022 | 
    
| Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE)  | 
    
| Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)  | 
    
| References | ref13 ref15 ref14 ref11 pozar (ref20) 2011 ref10 ref2 ref17 ref16 bogatin (ref21) 2015 ref18 xu (ref19) 2019 ref8 paul (ref23) 2007 ref7 ref9 ref4 ref3 jin (ref22) 1997 ref6 ref5 zhang (ref12) 2011 farinelli (ref1) 2014  | 
    
| References_xml | – ident: ref2 doi: 10.1109/TMTT.2013.2295769 – year: 1997 ident: ref22 publication-title: Dielectric Physics – ident: ref17 doi: 10.1109/ICSD.2010.5568220 – start-page: 195 year: 2014 ident: ref1 article-title: A 0-10GHz SP16T MEMS switch for switched beam satellite antenna systems publication-title: Proc 4th Eur Microw Conf – ident: ref4 doi: 10.1109/TCPMT.2019.2920918 – ident: ref11 doi: 10.1002/mmce.22271 – year: 2007 ident: ref23 publication-title: Analysis of Multiconductor Transmission Lines – ident: ref8 doi: 10.1109/TMTT.2018.2838147 – year: 2011 ident: ref20 publication-title: Microwave Engineering – ident: ref7 doi: 10.1587/transele.E100.C.1052 – ident: ref14 doi: 10.1109/TIM.2020.3047194 – year: 2015 ident: ref21 publication-title: Signal and Power Integrity Simplified – ident: ref3 doi: 10.1109/EMCSI.2018.8495293 – start-page: 1 year: 2019 ident: ref19 article-title: FTIR spectroscopy for molecular level description of water vapor sorption in two hydrosphobic polymers publication-title: Proc 10th Workshop Hyperspectral Imag Signal Process Evol Remote Sens (WHISPERS) – ident: ref10 doi: 10.1109/TCPMT.2019.2931890 – ident: ref18 doi: 10.1109/OPTIM.2012.6231788 – ident: ref15 doi: 10.1109/ICPADM.2015.7295341 – start-page: 1797 year: 2011 ident: ref12 article-title: The research of insulation failure on signals transmission in electrical connector publication-title: Proc Int Conf Mech Autom Control Eng (MACE) – ident: ref16 doi: 10.1007/s11664-019-07651-3 – ident: ref9 doi: 10.1109/33.76514 – ident: ref6 doi: 10.1109/TCPMT.2017.2688023 – ident: ref5 doi: 10.1109/TCPMT.2017.2776405 – ident: ref13 doi: 10.1109/SPCE50045.2020.9296167  | 
    
| SSID | ssj0014526 | 
    
| Score | 2.3924053 | 
    
| Snippet | Radio frequency coaxial connectors are key components in circuits for signal transmission and directly influence the stability of communication systems. It is... | 
    
| SourceID | proquest crossref ieee  | 
    
| SourceType | Aggregation Database Enrichment Source Index Database Publisher  | 
    
| StartPage | 1522 | 
    
| SubjectTerms | Communications systems Conductors Connector degradation Connectors Contacts Degradation dielectric Dielectrics Electromagnetic fields Electromagnetism Equivalent circuits humidity Integrated circuit modeling Material properties Polytetrafluoroethylene Signal integrity Signal reflection Signal transmission Three dimensional models Transmission loss Water film  | 
    
| Title | Modeling of the Signal Transmission of a Coaxial Connector With a Degraded Dielectric Layer in a Humid Environment | 
    
| URI | https://ieeexplore.ieee.org/document/9815080 https://www.proquest.com/docview/2698813486  | 
    
| Volume | 29 | 
    
| hasFullText | 1 | 
    
| inHoldings | 1 | 
    
| isFullTextHit | |
| isPrint | |
| journalDatabaseRights | – providerCode: PRVIEE databaseName: IEEE Electronic Library (IEL) customDbUrl: eissn: 1558-4135 dateEnd: 99991231 omitProxy: false ssIdentifier: ssj0014526 issn: 1070-9878 databaseCode: RIE dateStart: 19940101 isFulltext: true titleUrlDefault: https://ieeexplore.ieee.org/ providerName: IEEE  | 
    
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3fSxwxEB6sINiH-qvF06vkoU_FPfdnNnmUuxNb2r5U0bclyWTbpXJXdA-kf31nsnunVCm-LSRZFmY2833JNzMAH0yZ517lOipcbZmgFJHxWkcUimxea6NLDALZb_L8Mv98XVyvwfEqF8Z7H8RnfsSP4S4f527BR2UnWnH1ciLor0olu1yt1Y0Bt8ru9IVxRDxa9TeYSaxPLibTT8QE05QIKrkrZ_U9ikGhqcqTnTiEl7Mt-Lr8sE5V8mu0aO3I_fmnZuNLv3wb3vQ4U5x2jrEDa362C68fVR_chY2g_nR3e3DLHdE4L13Ma0GIUHxvfvDqEMjIEfhEjYeMGM_NPXmsCPoYPu8XV037kwYmXHQCPYpJ03XWaZz4YgjPi2ZGw-Q1DYrpQ1bdW7g8m16Mz6O-GUPkCBG0Ee2M6FgTJ2M0ymdYplYZQlcFYlJbW2JiyxwJnaBMNcGQUruY-G-CSCwJZfYO1mfzmd8HkSRG29qmiZNZTjOtNqnMnPK1qw0WfgDx0jyV6yuVc8OMmyowllhXbNGKLVr1Fh3Ax9WS312Zjv9N3mMLrSb2xhnAcOkDVf8j31Wp1EolWa7kwfOrDmGT391pAoew3t4u_HvCKa09Cg76F83U4vU | 
    
| linkProvider | IEEE | 
    
| linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1Nb9QwEB1VRRVwoKWlYqGADz0hss2Hk9jHqrvVFra9sBW9RbbHaSPQLmqzEuLXM-Nkl6ogxC2SbSXSTDzv2W9mAA5NKaVXUke5qy0TlDwyXuuIQpGVtTa6xCCQvSgml_LjVX61AR_WuTDe-yA-80N-DHf5uHBLPio70oqrlxNBf5RLKfMuW2t9Z8DNsjuFYRwRk1b9HWYS66PZaHxGXDBNiaKSw3Je370oFNqq_LEXhwBzug3nq0_rdCVfh8vWDt3PB1Ub__fbd-BZjzTFcecaz2HDz3fh6b36g7uwFfSf7m4PbrknGmemi0UtCBOKz801rw6hjFyBz9R4yIiThflBPiuCQoZP_MWXpr2hgRGXnUCPYtR0vXUaJ6aGEL1o5jRMftOgGP_Oq3sBl6fj2ckk6tsxRI4wQRvR3oiOVXFFjEb5DMvUKkP4KkdMamtLTGwpkfAJFqkmIFJqFxMDThCJJ2GR7cPmfDH3L0EkidG2tmniikzSTKtNWmRO-drVBnM_gHhlnsr1tcq5Zca3KnCWWFds0YotWvUWHcD79ZLvXaGOf03eYwutJ_bGGcDBygeq_le-q9JCK5VkUhWv_r7qHTyezM6n1fTs4tNreMLv6RSCB7DZ3i79G0ItrX0bnPUX16bmQg | 
    
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Modeling+of+the+Signal+Transmission+of+a+Coaxial+Connector+With+a+Degraded+Dielectric+Layer+in+a+Humid+Environment&rft.jtitle=IEEE+transactions+on+dielectrics+and+electrical+insulation&rft.au=Wang%2C+Wenjia&rft.au=Gao%2C+Jinchun&rft.au=Flowers%2C+George+T&rft.au=Wang%2C+Ziren&rft.date=2022-08-01&rft.pub=The+Institute+of+Electrical+and+Electronics+Engineers%2C+Inc.+%28IEEE%29&rft.issn=1070-9878&rft.eissn=1558-4135&rft.volume=29&rft.issue=4&rft.spage=1522&rft_id=info:doi/10.1109%2FTDEI.2022.3188055&rft.externalDBID=NO_FULL_TEXT | 
    
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1070-9878&client=summon | 
    
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1070-9878&client=summon | 
    
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1070-9878&client=summon |