A new algorithm on the automatic TFT‐LCD mura defects inspection based on an effective background reconstruction - Ngo, Chinh; Park, Yong Jin; Jung, Jeehyun; Hassan, Rizwan Ul; Seok, Jongwon (Journal of the Society for Information Display, 2017)
Keywords: background reconstruction; Brightness; Case studies; Crystal defects; Defects; Discrete cosine transform; Filtration; image processing; Inspection; mura defect; Reconstruction; Test procedures; TFT‐LCD