A new algorithm on the automatic TFT‐LCD mura defects inspection based on an effective background reconstruction
In this study, an automatic detection method for mura defects is developed based on an accurate reconstruction of the background and precise evaluation of the mura index level. To achieve this, an effective background reconstruction method is first developed to represent the brightness intensity of...
Saved in:
| Published in | Journal of the Society for Information Display Vol. 25; no. 12; pp. 737 - 752 |
|---|---|
| Main Authors | , , , , |
| Format | Journal Article |
| Language | English |
| Published |
Campbell
Wiley Subscription Services, Inc
01.12.2017
|
| Subjects | |
| Online Access | Get full text |
| ISSN | 1071-0922 1938-3657 |
| DOI | 10.1002/jsid.622 |
Cover
| Abstract | In this study, an automatic detection method for mura defects is developed based on an accurate reconstruction of the background and precise evaluation of the mura index level. To achieve this, an effective background reconstruction method is first developed to represent the brightness intensity of the display panel. As a result, any nonuniform brightness of the background can be removed effectively. Furthermore, the associated mura level is quantified based on the sensitivity of the human eye in order to alternatively grade the liquid‐crystal display panels. The main focus of this study is on the reconstruction of the background from the display under test image. The proposed method takes full advantage of the following three existing methods: low‐pass filtering, discrete cosine transform, and polynomial surface fitting. By applying the method to several case studies, we have shown that it is more effective compared with other existing methods in detecting various types of mura defects.
We developed an algorithm to adaptively reconstruct the background image with high accuracy and a highly efficient computation process for the entire mura detection. We applied the reconstructed background to the image segmentation process based on the sensitivity of the human eye. We finally validated the proposed method by comparing the results obtained with those of previous studies. |
|---|---|
| AbstractList | In this study, an automatic detection method for mura defects is developed based on an accurate reconstruction of the background and precise evaluation of the mura index level. To achieve this, an effective background reconstruction method is first developed to represent the brightness intensity of the display panel. As a result, any nonuniform brightness of the background can be removed effectively. Furthermore, the associated mura level is quantified based on the sensitivity of the human eye in order to alternatively grade the liquid‐crystal display panels. The main focus of this study is on the reconstruction of the background from the display under test image. The proposed method takes full advantage of the following three existing methods: low‐pass filtering, discrete cosine transform, and polynomial surface fitting. By applying the method to several case studies, we have shown that it is more effective compared with other existing methods in detecting various types of mura defects. In this study, an automatic detection method for mura defects is developed based on an accurate reconstruction of the background and precise evaluation of the mura index level. To achieve this, an effective background reconstruction method is first developed to represent the brightness intensity of the display panel. As a result, any nonuniform brightness of the background can be removed effectively. Furthermore, the associated mura level is quantified based on the sensitivity of the human eye in order to alternatively grade the liquid‐crystal display panels. The main focus of this study is on the reconstruction of the background from the display under test image. The proposed method takes full advantage of the following three existing methods: low‐pass filtering, discrete cosine transform, and polynomial surface fitting. By applying the method to several case studies, we have shown that it is more effective compared with other existing methods in detecting various types of mura defects. We developed an algorithm to adaptively reconstruct the background image with high accuracy and a highly efficient computation process for the entire mura detection. We applied the reconstructed background to the image segmentation process based on the sensitivity of the human eye. We finally validated the proposed method by comparing the results obtained with those of previous studies. |
| Author | Hassan, Rizwan Ul Park, Yong Jin Ngo, Chinh Jung, Jeehyun Seok, Jongwon |
| Author_xml | – sequence: 1 givenname: Chinh surname: Ngo fullname: Ngo, Chinh organization: SP Technology Co., Ltd – sequence: 2 givenname: Yong Jin surname: Park fullname: Park, Yong Jin organization: SP Technology Co., Ltd – sequence: 3 givenname: Jeehyun surname: Jung fullname: Jung, Jeehyun organization: Chung‐Ang University – sequence: 4 givenname: Rizwan Ul surname: Hassan fullname: Hassan, Rizwan Ul organization: Chung‐Ang University – sequence: 5 givenname: Jongwon orcidid: 0000-0003-3139-8915 surname: Seok fullname: Seok, Jongwon email: seokj@cau.ac.kr organization: Chung‐Ang University |
| BookMark | eNp1kM9OAjEQxhuDiYAmPkITL14W2-7_IwFRDIkH8bzpdmehuLTYdiXcfASf0SexK56MnubLzO-byXwD1FNaAUKXlIwoIexmY2U1Shg7QX2ah1kQJnHa85qkNCA5Y2doYO3Gk0kcJX1kxljBHvNmpY106y3WCrs1YN46veVOCrycLT_fPxaTKd62huMKahDOYqnszgvp-ZJbqDojVxjqbizfwHfFy8roVlXYgNDKOtN-8-fotOaNhYufOkTPs9vl5D5YPN7NJ-NFIFgesiDNM4hJmpcxgSRJiYjympUEylJkHAQroyqK6ozlFaW0AhZSKFMIszgvScgZhEN0ddy7M_q1BeuKjW6N8icLRkhGGU2zzFPXR0oYba2ButgZueXmUFBSdIkWXaKFT9Sjo1-okI53LznDZfOXITga9rKBw7-Li4en-bTjvwCqHot_ |
| CitedBy_id | crossref_primary_10_1155_2022_6505372 crossref_primary_10_1109_ACCESS_2021_3076792 crossref_primary_10_1002_sdtp_13126 crossref_primary_10_3390_electronics11172665 crossref_primary_10_1002_jsid_1185 crossref_primary_10_1109_TIM_2022_3188550 crossref_primary_10_3390_machines10090723 crossref_primary_10_1002_jsid_1171 crossref_primary_10_1002_jsid_997 crossref_primary_10_3390_s22145426 crossref_primary_10_1016_j_measurement_2021_109973 crossref_primary_10_1109_ACCESS_2020_3029127 crossref_primary_10_1109_TASE_2018_2823709 crossref_primary_10_1016_j_cie_2020_106530 crossref_primary_10_3390_app13074540 crossref_primary_10_3390_electronics12132965 |
| Cites_doi | 10.3182/20080706-5-KR-1001.01386 10.1299/jamdsm.2.441 10.1109/MVA.2015.7153163 10.1016/j.patcog.2009.09.006 10.4028/www.scientific.net/KEM.364-366.400 10.1007/s10043-011-0041-z 10.1007/s10043-011-0051-x 10.1109/LSP.2009.2014113 10.1117/12.301232 10.1889/1.2976659 10.1109/ICCAS.2007.4406684 10.1889/JSID17.8.671 10.1109/TENCON.2004.1414400 10.1243/09544054JEM1067 |
| ContentType | Journal Article |
| Copyright | Copyright 2018 Society for Information Display 2017 The Society for Information Display |
| Copyright_xml | – notice: Copyright 2018 Society for Information Display – notice: 2017 The Society for Information Display |
| DBID | AAYXX CITATION 7SC 8FD JQ2 L7M L~C L~D |
| DOI | 10.1002/jsid.622 |
| DatabaseName | CrossRef Computer and Information Systems Abstracts Technology Research Database ProQuest Computer Science Collection Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Academic Computer and Information Systems Abstracts Professional |
| DatabaseTitle | CrossRef Computer and Information Systems Abstracts Technology Research Database Computer and Information Systems Abstracts – Academic Advanced Technologies Database with Aerospace ProQuest Computer Science Collection Computer and Information Systems Abstracts Professional |
| DatabaseTitleList | CrossRef Computer and Information Systems Abstracts |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering |
| EISSN | 1938-3657 |
| EndPage | 752 |
| ExternalDocumentID | 10_1002_jsid_622 JSID622 |
| Genre | article |
| GrantInformation_xml | – fundername: Business for Cooperative R&D between Industry, Academy, and Research Institute funderid: C0414502 – fundername: Chung‐Ang University |
| GroupedDBID | 05W 0R~ 1OB 1OC 29L 31~ 33P 3SF 50Y 52U 5GY 8-0 8-1 AAESR AAEVG AAHQN AAMMB AAMNL AANHP AANLZ AAONW AASGY AAXRX AAYCA AAZKR ABCUV ABDPE ABJNI ACAHQ ACBWZ ACCZN ACGFS ACPOU ACRPL ACXBN ACXQS ACYXJ ADBBV ADEOM ADIZJ ADKYN ADMGS ADMLS ADNMO ADOZA ADXAS ADZMN AEFGJ AEIGN AEIMD AENEX AEUYR AEYWJ AFBPY AFFPM AFGKR AFWVQ AGHNM AGQPQ AGXDD AGYGG AHBTC AI. AIDQK AIDYY AIQQE AITYG AIURR AJXKR ALMA_UNASSIGNED_HOLDINGS ALUQN ALVPJ AMBMR AMYDB ASPBG ATUGU AUFTA AVWKF AZFZN AZVAB BDRZF BFHJK BHBCM BMNLL BMXJE BNHUX BOGZA BRXPI CMOOK CS3 DCZOG DPXWK DRFUL DRSTM DU5 EBS EJD F5P FEDTE G-S GODZA HGLYW HSZ HVGLF HZ~ I-F LATKE LEEKS LH4 LITHE LOXES LUTES LYRES MEWTI MRFUL MRSTM MSFUL MSSTM MXFUL MXSTM MY~ O66 O9- P2W PALCI PQQKQ R.K RIWAO RJQFR ROL SAMSI SJN SUPJJ VH1 WBKPD WIH WIK WLBEL WOHZO WXSBR WYISQ ZE2 ZZTAW AAYXX CITATION 7SC 8FD JQ2 L7M L~C L~D |
| ID | FETCH-LOGICAL-c2932-798e5079b50e6670c49f2b0ebbc8aec2b4d44f829d111de231eb7e3859b03a2e3 |
| ISSN | 1071-0922 |
| IngestDate | Sun Jul 13 04:48:13 EDT 2025 Sat Oct 25 05:28:09 EDT 2025 Thu Apr 24 23:11:26 EDT 2025 Sun Sep 21 06:27:39 EDT 2025 |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 12 |
| Language | English |
| License | http://onlinelibrary.wiley.com/termsAndConditions#vor |
| LinkModel | OpenURL |
| MergedId | FETCHMERGED-LOGICAL-c2932-798e5079b50e6670c49f2b0ebbc8aec2b4d44f829d111de231eb7e3859b03a2e3 |
| Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 |
| ORCID | 0000-0003-3139-8915 |
| PQID | 2008121788 |
| PQPubID | 2034128 |
| PageCount | 16 |
| ParticipantIDs | proquest_journals_2008121788 crossref_primary_10_1002_jsid_622 crossref_citationtrail_10_1002_jsid_622 wiley_primary_10_1002_jsid_622_JSID622 |
| PublicationCentury | 2000 |
| PublicationDate | December 2017 2017-12-00 20171201 |
| PublicationDateYYYYMMDD | 2017-12-01 |
| PublicationDate_xml | – month: 12 year: 2017 text: December 2017 |
| PublicationDecade | 2010 |
| PublicationPlace | Campbell |
| PublicationPlace_xml | – name: Campbell |
| PublicationTitle | Journal of the Society for Information Display |
| PublicationYear | 2017 |
| Publisher | Wiley Subscription Services, Inc |
| Publisher_xml | – name: Wiley Subscription Services, Inc |
| References | 2004; 87 2007; 19 2010; 43 2001 2008; 16 1998 2008 2006 2009; 8 2004 2015 2008; 41 1975; 11 2013 2008; 222 2008; 2 2011; 18 2009; 16 2005; 2005 2009; 17 e_1_2_6_21_1 Liang‐Chia C. (e_1_2_6_7_1) 2007; 19 e_1_2_6_10_1 e_1_2_6_20_1 Otsu N. (e_1_2_6_25_1) 1975; 11 Chuang Y.‐C. (e_1_2_6_15_1) 2009; 8 Lee J. Y. (e_1_2_6_6_1) 2004; 87 e_1_2_6_9_1 e_1_2_6_8_1 e_1_2_6_19_1 e_1_2_6_5_1 e_1_2_6_4_1 e_1_2_6_13_1 e_1_2_6_14_1 e_1_2_6_24_1 e_1_2_6_3_1 e_1_2_6_11_1 e_1_2_6_23_1 e_1_2_6_2_1 e_1_2_6_12_1 e_1_2_6_22_1 e_1_2_6_17_1 e_1_2_6_18_1 e_1_2_6_16_1 |
| References_xml | – volume: 87 start-page: 2371 issue: 10 year: 2004 end-page: 2378 article-title: Automatic detection of region‐mura defect in TFT‐LCD publication-title: IEICE TRANSACTIONS on Information and Systems – volume: 19 issue: 1 year: 2007 article-title: Automatic TFT‐LCD mura defect inspection using discrete cosine transform‐based background filtering and 'just noticeable difference' quantification strategies publication-title: Measurement Science and Technology – start-page: 2007 – volume: 2005 year: 2005 – volume: 11 start-page: 23 issue: 285–296 year: 1975 end-page: 27 article-title: A threshold selection method from gray‐level histograms publication-title: Automatica – volume: 18 start-page: 253 issue: 2 year: 2011 end-page: 255 article-title: Split bregman method‐based background extraction for blob‐mura defect detection in thin film transistor‐liquid crystal display image publication-title: Optical Review – volume: 17 start-page: 671 issue: 8 year: 2009 end-page: 680 article-title: Mura – type effect on human – vision inspection publication-title: Journal of Society for Information Display – volume: 16 start-page: 969 issue: 9 year: 2008 end-page: 976 article-title: Measurement of human visual perception for Mura with some featrues publication-title: Journal of Society for Information Display – year: 2001 – start-page: 400 year: 2008 end-page: 403 – year: 2006 – year: 2004 – volume: 2 start-page: 441 issue: 3 year: 2008 end-page: 453 article-title: TFT‐LCD Mura defect detection using wavelet and cosine transforms publication-title: Journal of advanced mechanical design, systems, and manufacturing – volume: 16 start-page: 311 issue: 4 year: 2009 end-page: 314 article-title: A New Mura Defect Inspection Way for TFT‐LCD Using Level Set Method publication-title: IEEE Signal Processing Letters – start-page: 186 year: 2015 end-page: 189 – volume: 222 start-page: 1489 issue: 11 year: 2008 end-page: 1501 article-title: TFT‐LCD Mura defects automatic inspection system using linear regression diagnostic model publication-title: Proceedings of the Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture – volume: 43 start-page: 1129 issue: 3 year: 2010 end-page: 1141 article-title: Defect detection of uneven brightness in low‐contrast images using basis image representation publication-title: Pattern Recognition – volume: 8 start-page: 148 issue: 3 year: 2009 end-page: 154 article-title: Automatic TFT‐LCD mura inspection based on studentized residuals in regression analysis publication-title: Industrial Engineering and Management Systems – volume: 18 start-page: 191 issue: 2 year: 2011 end-page: 196 article-title: Effective defect detection in thin film transistor liquid crystal display images using adaptive multi‐level defect detection and probability density function publication-title: Optical review – volume: 41 start-page: 8190 issue: 2 year: 2008 end-page: 8195 article-title: Region Mura Detection Using Efficient High Pass Filtering Based on Fast Average Operation publication-title: IFAC Proceedings Volumes – year: 1998 – year: 2013 – ident: e_1_2_6_14_1 doi: 10.3182/20080706-5-KR-1001.01386 – ident: e_1_2_6_13_1 doi: 10.1299/jamdsm.2.441 – volume: 8 start-page: 148 issue: 3 year: 2009 ident: e_1_2_6_15_1 article-title: Automatic TFT‐LCD mura inspection based on studentized residuals in regression analysis publication-title: Industrial Engineering and Management Systems – ident: e_1_2_6_23_1 – ident: e_1_2_6_20_1 doi: 10.1109/MVA.2015.7153163 – ident: e_1_2_6_16_1 doi: 10.1016/j.patcog.2009.09.006 – ident: e_1_2_6_11_1 doi: 10.4028/www.scientific.net/KEM.364-366.400 – ident: e_1_2_6_24_1 – ident: e_1_2_6_21_1 – volume: 19 start-page: 015507 issue: 1 year: 2007 ident: e_1_2_6_7_1 article-title: Automatic TFT‐LCD mura defect inspection using discrete cosine transform‐based background filtering and 'just noticeable difference' quantification strategies publication-title: Measurement Science and Technology – ident: e_1_2_6_19_1 doi: 10.1007/s10043-011-0041-z – ident: e_1_2_6_17_1 doi: 10.1007/s10043-011-0051-x – ident: e_1_2_6_18_1 doi: 10.1109/LSP.2009.2014113 – ident: e_1_2_6_5_1 doi: 10.1117/12.301232 – ident: e_1_2_6_9_1 – volume: 11 start-page: 23 issue: 285 year: 1975 ident: e_1_2_6_25_1 article-title: A threshold selection method from gray‐level histograms publication-title: Automatica – ident: e_1_2_6_22_1 – volume: 87 start-page: 2371 issue: 10 year: 2004 ident: e_1_2_6_6_1 article-title: Automatic detection of region‐mura defect in TFT‐LCD publication-title: IEICE TRANSACTIONS on Information and Systems – ident: e_1_2_6_2_1 doi: 10.1889/1.2976659 – ident: e_1_2_6_4_1 – ident: e_1_2_6_10_1 doi: 10.1109/ICCAS.2007.4406684 – ident: e_1_2_6_3_1 doi: 10.1889/JSID17.8.671 – ident: e_1_2_6_8_1 doi: 10.1109/TENCON.2004.1414400 – ident: e_1_2_6_12_1 doi: 10.1243/09544054JEM1067 |
| SSID | ssj0026546 |
| Score | 2.2661138 |
| Snippet | In this study, an automatic detection method for mura defects is developed based on an accurate reconstruction of the background and precise evaluation of the... |
| SourceID | proquest crossref wiley |
| SourceType | Aggregation Database Enrichment Source Index Database Publisher |
| StartPage | 737 |
| SubjectTerms | background reconstruction Brightness Case studies Crystal defects Defects Discrete cosine transform Filtration image processing Inspection mura defect Reconstruction Test procedures TFT‐LCD |
| Title | A new algorithm on the automatic TFT‐LCD mura defects inspection based on an effective background reconstruction |
| URI | https://onlinelibrary.wiley.com/doi/abs/10.1002%2Fjsid.622 https://www.proquest.com/docview/2008121788 |
| Volume | 25 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| journalDatabaseRights | – providerCode: PRVEBS databaseName: Inspec with Full Text customDbUrl: eissn: 1938-3657 dateEnd: 20241105 omitProxy: false ssIdentifier: ssj0026546 issn: 1071-0922 databaseCode: ADMLS dateStart: 20110101 isFulltext: true titleUrlDefault: https://www.ebsco.com/products/research-databases/inspec-full-text providerName: EBSCOhost |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3dbtMwFLZKdwMXaONHDMZkJAQXUUqaHye-rNZNW7RNSGulcRXFjrMGumRaW6HtikfgSXgonoTj2HGysUmDm7Sy4p4058v5cc75jNB7ynNCUi-08zAntp_5qQ1uiNgZj4gfDCMR1Oz8R8dkf-rHp8Fpr_erU7W0WrIBv76zr-R_tApjoFfZJfsPmjU_CgPwHfQLR9AwHB-k45HcENxK52cVpPizc73wb6WrZaWYWCd7E1PNcLgzts5Xl6mVCVXCUZSqzRJmSV-WWXVhsq7wqIvaU_5Ndn3UHS68arlm74lopexuFahudaoljIvFxbwt2Dk-U0u0s6I069Gfddn2F7n9UVwY1MbaHsVCzK5WZWszFwv9Equ4_g4XPp13lzDALbblIMrqQpxjO1Q1KA-EGqNgiT2i2KsbU616pBtIuh3DGyrqGO3DQ8WK-5d7UHSzXwEPA9JI6zJw3_KMpl5RcTu7iZyZwMxHaM0FL-L00dpofHR4YlJ83Rpm_lBDd-y4nxqpNwOgNqvp5kZ1cDNZR0-1DvFIQWwD9UT5DD3pcFU-R5cjDGDDBmy4KjEoHBuwYQDb7x8_AWZYwgxrmOEWZriGmZyYltjADLcwwzdh9gJN93YnO_u23rDD5hA1QqZG4dl2QsoCRxASOtynucscwRiPUsFdBrbAzyOXZuBhMwGphWCh8KKAMsdLXeG9RP2yKsUrhEOaQ_RGIFvnAmZFLHI4hdSWErioYRZtoo_NXUy4ZrOXm6rMk9u62kTvzJkXisHljnO2GkUk-vle1Bu0DiFjj0DYh1o5985P4pODMXy-foCsN-hx-wxsoT7cU_EWAtsl29Zo-gOpxqmO |
| linkProvider | EBSCOhost |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=A+new+algorithm+on+the+automatic+TFT%E2%80%90LCD+mura+defects+inspection+based+on+an+effective+background+reconstruction&rft.jtitle=Journal+of+the+Society+for+Information+Display&rft.au=Ngo%2C+Chinh&rft.au=Park%2C+Yong+Jin&rft.au=Jung%2C+Jeehyun&rft.au=Hassan%2C+Rizwan+Ul&rft.date=2017-12-01&rft.issn=1071-0922&rft.eissn=1938-3657&rft.volume=25&rft.issue=12&rft.spage=737&rft.epage=752&rft_id=info:doi/10.1002%2Fjsid.622&rft.externalDBID=n%2Fa&rft.externalDocID=10_1002_jsid_622 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1071-0922&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1071-0922&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1071-0922&client=summon |