Damage Localization of Stacker's Track Based on EEMD-EMD and DBSCAN Cluster Algorithms

The vibration and friction triggered by the long-term operation of stacker inevitably lead to the damage problem of stacker's track. In order to ensure the stable operation of the stacker, a novel scheme is proposed to address an accurate damage localization problem of the stacker's track...

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Published inIEEE transactions on instrumentation and measurement Vol. 69; no. 5; pp. 1981 - 1992
Main Authors Li, Shupan, Qin, Na, Huang, Darong, Huang, Deqing, Ke, Lanyan
Format Journal Article
LanguageEnglish
Published New York IEEE 01.05.2020
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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ISSN0018-9456
1557-9662
DOI10.1109/TIM.2019.2919375

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Abstract The vibration and friction triggered by the long-term operation of stacker inevitably lead to the damage problem of stacker's track. In order to ensure the stable operation of the stacker, a novel scheme is proposed to address an accurate damage localization problem of the stacker's track in industrial environment based on ensemble empirical mode decomposition-empirical mode decomposition (EEMD-EMD) and density-based spatial clustering of applications with noise (DBSCAN). First, the original electric current signal with unbalanced distribution is processed by fixed-interval smoothing and cubic Hermite interpolation algorithms. Second, the EEMD-EMD method, which solves the mode-mixing problem, is adopted to decompose the preprocessed signal into well-defined intrinsic mode functions (IMFs). Third, based on Hilbert-Huang transform (HHT) of the IMFs, the preprocessed signal and the difference of average instantaneous amplitudes in two adjacent time points are considered as the 2-D feature vector input of the DBSCAN algorithm. As such, damage locations of the stacker's track are detected by means of the outliers that are obtained by the DBSCAN algorithm. The efficiency of the proposed localization scheme and its superiority over the existing cooperative damage localization methods, namely, the box-plot method, the pulse coupling neural network (PCNN) and wavelet transform (WT) theory method, and the box-plot and WT method, are verified through experiments using the data provided by State Grid Measuring Center of China.
AbstractList The vibration and friction triggered by the long-term operation of stacker inevitably lead to the damage problem of stacker's track. In order to ensure the stable operation of the stacker, a novel scheme is proposed to address an accurate damage localization problem of the stacker's track in industrial environment based on ensemble empirical mode decomposition-empirical mode decomposition (EEMD-EMD) and density-based spatial clustering of applications with noise (DBSCAN). First, the original electric current signal with unbalanced distribution is processed by fixed-interval smoothing and cubic Hermite interpolation algorithms. Second, the EEMD-EMD method, which solves the mode-mixing problem, is adopted to decompose the preprocessed signal into well-defined intrinsic mode functions (IMFs). Third, based on Hilbert-Huang transform (HHT) of the IMFs, the preprocessed signal and the difference of average instantaneous amplitudes in two adjacent time points are considered as the 2-D feature vector input of the DBSCAN algorithm. As such, damage locations of the stacker's track are detected by means of the outliers that are obtained by the DBSCAN algorithm. The efficiency of the proposed localization scheme and its superiority over the existing cooperative damage localization methods, namely, the box-plot method, the pulse coupling neural network (PCNN) and wavelet transform (WT) theory method, and the box-plot and WT method, are verified through experiments using the data provided by State Grid Measuring Center of China.
Author Huang, Deqing
Ke, Lanyan
Li, Shupan
Qin, Na
Huang, Darong
Author_xml – sequence: 1
  givenname: Shupan
  surname: Li
  fullname: Li, Shupan
  organization: Institute of Systems Science and Technology, Southwest Jiaotong University, Chengdu, China
– sequence: 2
  givenname: Na
  surname: Qin
  fullname: Qin, Na
  organization: Institute of Systems Science and Technology, Southwest Jiaotong University, Chengdu, China
– sequence: 3
  givenname: Darong
  surname: Huang
  fullname: Huang, Darong
  email: drhuang@cqjtu.edu.cn
  organization: School of Information Science and Engineering, Chongqing Jiaotong University, Chongqing, China
– sequence: 4
  givenname: Deqing
  surname: Huang
  fullname: Huang, Deqing
  email: elehd@home.swjtu.edu.cn
  organization: Institute of Systems Science and Technology, Southwest Jiaotong University, Chengdu, China
– sequence: 5
  givenname: Lanyan
  surname: Ke
  fullname: Ke, Lanyan
  organization: School of Information Science and Engineering, Chongqing Jiaotong University, Chongqing, China
BookMark eNp9kL1PwzAQxS0EEm1hR2KxxMCUYsfx19gvoFILQwtr5DhOSUnjYrsD_PW4tGJgYDjdSffevdOvC05b2xoArjDqY4zk3XI676cIy34qsSScnoAOppQnkrH0FHQQwiKRGWXnoOv9GiHEWcY74HWsNmpl4Mxq1dRfKtS2hbaCi6D0u3G3Hi5dnOBQeVPCuJtM5uMkFlRtCcfDxWjwBEfNzgfj4KBZWVeHt42_AGeVary5PPYeeLmfLEePyez5YToazBId3wxJVUhqOK0Y5UQSVmKhkVKIZ5wVkklVFkQaXVCW6SLVQiidaWTKiiOuJS1L0gM3h7tbZz92xod8bXeujZF5SoTAGAtGogodVNpZ752p8q2rN8p95hjle3p5pJfv6eVHetHC_lh0HX7oBKfq5j_j9cFYG2N-cwQnKGOCfAOfx3x5
CODEN IEIMAO
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ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2020
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2020
DBID 97E
RIA
RIE
AAYXX
CITATION
7SP
7U5
8FD
L7M
DOI 10.1109/TIM.2019.2919375
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005–Present
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Electronics & Communications Abstracts
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
DatabaseTitle CrossRef
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
DatabaseTitleList
Solid State and Superconductivity Abstracts
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Physics
EISSN 1557-9662
EndPage 1992
ExternalDocumentID 10_1109_TIM_2019_2919375
8730468
Genre orig-research
GrantInformation_xml – fundername: National Natural Science Foundation of China
  grantid: 61603316; 61773323; 61733015; 61433011
  funderid: 10.13039/501100001809
– fundername: Fundamental Research Funds for the Central Universities
  grantid: 2682018CX15
  funderid: 10.13039/501100012226
– fundername: Sichuan Province Science and Technology Support Program
  grantid: 2019YJ0210; 2019YFG0345
  funderid: 10.13039/100012542
GroupedDBID -~X
0R~
29I
4.4
5GY
5VS
6IK
85S
8WZ
97E
A6W
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFO
ACIWK
ACNCT
AENEX
AETIX
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
AKJIK
AKQYR
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
F5P
HZ~
H~9
IAAWW
IBMZZ
ICLAB
IDIHD
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
O9-
OCL
P2P
RIA
RIE
RNS
TN5
TWZ
VH1
VJK
AAYXX
CITATION
7SP
7U5
8FD
L7M
ID FETCH-LOGICAL-c291t-fb95e75f6573936d18c0aa07476b969adb39ecb564cb2c88ac4c0edf707c95dd3
IEDL.DBID RIE
ISSN 0018-9456
IngestDate Wed Oct 15 13:14:27 EDT 2025
Wed Oct 01 02:46:09 EDT 2025
Thu Apr 24 23:03:48 EDT 2025
Wed Aug 27 02:35:28 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 5
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
https://doi.org/10.15223/policy-029
https://doi.org/10.15223/policy-037
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c291t-fb95e75f6573936d18c0aa07476b969adb39ecb564cb2c88ac4c0edf707c95dd3
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
PQID 2388111863
PQPubID 85462
PageCount 12
ParticipantIDs crossref_primary_10_1109_TIM_2019_2919375
crossref_citationtrail_10_1109_TIM_2019_2919375
proquest_journals_2388111863
ieee_primary_8730468
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2020-05-01
PublicationDateYYYYMMDD 2020-05-01
PublicationDate_xml – month: 05
  year: 2020
  text: 2020-05-01
  day: 01
PublicationDecade 2020
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE transactions on instrumentation and measurement
PublicationTitleAbbrev TIM
PublicationYear 2020
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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SSID ssj0007647
Score 2.4579022
Snippet The vibration and friction triggered by the long-term operation of stacker inevitably lead to the damage problem of stacker's track. In order to ensure the...
The vibration and friction triggered by the long-term operation of stacker inevitably lead to the damage problem of stacker’s track. In order to ensure the...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 1981
SubjectTerms Algorithms
Anomaly detection
Clustering
Clustering algorithms
Current distribution
Damage localization
Damage location
Data preprocessing
density-based spatial clustering of applications with noise (DBSCAN)
empirical mode decomposition (EMD)
ensemble EMD (EEMD)
Feature extraction
Interpolation
Localization
Neural networks
Outliers (statistics)
Signal processing
Smoothing methods
stacker
Vibrations
Wavelet transforms
Title Damage Localization of Stacker's Track Based on EEMD-EMD and DBSCAN Cluster Algorithms
URI https://ieeexplore.ieee.org/document/8730468
https://www.proquest.com/docview/2388111863
Volume 69
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVIEE
  databaseName: IEEE Electronic Library (IEL)
  customDbUrl:
  eissn: 1557-9662
  dateEnd: 99991231
  omitProxy: false
  ssIdentifier: ssj0007647
  issn: 0018-9456
  databaseCode: RIE
  dateStart: 19630101
  isFulltext: true
  titleUrlDefault: https://ieeexplore.ieee.org/
  providerName: IEEE
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3PSyMxFH6oIKyH9deKXX-QgyCC0850kkxyrG1FxXpRF2_D5CVRaW0XO73sX2-SmRbRRTwMDEwCIS9578u8L98DOEqMTpiw7SihikVUK-n9IEZC8SzGDFGFckCDG35xT68e2MMSnC7uwhhjAvnMNP1ryOXrCc78r7KWyHweTyzDciZ4dVdr4XUzTit9zMRtYIcK5inJWLbuLgeewyWbbengimcUvgtBoabKJ0ccosv5Ogzm46pIJcPmrFRN_PdBsvG7A9-AnzXMJJ1qXWzCkhlvwdo78cEtWA3kT5xuw59e8eLcCrn2ca2-l0kmljgg6kkXx1PiIhoOyZmLeJq4b_3-oBe5hxRjTXpnt93ODemOZl5zgXRGj5PX5_LpZfoL7s_7d92LqK63EKGbmTKySjKTMcuZl8njOhEYF4VX2OdKcllolUqDinGKqo1CFEgxNtpmcYaSaZ3uwMp4Mja7QARXDN3hhxpuaGqYRGsdNLGamlTalDagNTdBjrUYua-JMcrDoSSWuTNa7o2W10ZrwMmix99KiOOLttveBot29fQ3YH9u5bzeqdPcQRbh_L3g6e__99qDH21_xg4kx31YKV9n5sABkVIdhhX4Bv-q11o
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3Pa9swFH50LWPtYT_6g6btNh0GYzAndizJ0jFNUtItzmXp6M1YT9JWmialcS776yfJTijbGD0YDJZA6EnvffL79D2AD4nRCRO2GyVUsYhqJb0fxEgonsWYIapQDiif8NEV_XLNrrfg8-YujDEmkM9M27-GXL5e4Mr_KuuIzOfxxDPYYZRSVt_W2vjdjNNaITNxW9jhgnVSMpad6WXuWVyy3ZUOsHhO4aMgFKqq_OWKQ3y5eAX5emQ1reS2vapUG3_9Idr41KG_hpcN0CS9emW8gS0z34e9R_KD-_A80D9xeQDfB-Wdcyxk7CNbczOTLCxxUNTTLj4uiYtpeEvOXczTxH0bDvNB5B5SzjUZnH_r9yakP1t51QXSm_1YPNxUP--Wh3B1MZz2R1FTcSFCNzNVZJVkJmOWMy-Ux3UiMC5Lr7HPleSy1CqVBhXjFFUXhSiRYmy0zeIMJdM6PYLt-WJujoEIrhi64w813NDUMInWOnBiNTWptCltQWdtggIbOXJfFWNWhGNJLAtntMIbrWiM1oJPmx73tRTHf9oeeBts2jXT34KztZWLZq8uCwdahPP4gqcn_-71Hl6Mpvm4GF9Ovp7CbtefuAPl8Qy2q4eVeetgSaXehdX4G3K32qc
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Damage+Localization+of+Stacker%E2%80%99s+Track+Based+on+EEMD-EMD+and+DBSCAN+Cluster+Algorithms&rft.jtitle=IEEE+transactions+on+instrumentation+and+measurement&rft.au=Li%2C+Shupan&rft.au=Qin%2C+Na&rft.au=Huang%2C+Darong&rft.au=Huang%2C+Deqing&rft.date=2020-05-01&rft.issn=0018-9456&rft.eissn=1557-9662&rft.volume=69&rft.issue=5&rft.spage=1981&rft.epage=1992&rft_id=info:doi/10.1109%2FTIM.2019.2919375&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_TIM_2019_2919375
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9456&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9456&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9456&client=summon