A Novel Degradation Modeling and Prognostic Framework for Closed-Loop Systems With Degrading Actuator - Si, Xiaosheng; Ren, Ziqiang; Hu, Xiaoxiang; Hu, Changhua; Shi, Quan (IEEE transactions on industrial electronics (1982), 2020)
Keywords: Actuators; Algorithms; Closed loop systems; Closed-loop system; Computer simulation; Degradation; Error reduction; Fault tolerance; fault tolerant control; Feedback control; Inertial platforms; life prediction; Mathematical models; Modelling; particle filter; performance degradation; Prediction methods; Process control; Process parameters; prognostics; Stochastic processes