Short-Circuit Fault Discrimination Using SiC JFET-Based Self-Powered Solid-State Circuit Breakers in a Residential DC Community Microgrid - Palaniappan, Karthik; Sedano, Willy; Vygoder, Mark; Hoeft, Nicholas; Cuzner, Robert; Shen, Z. John (IEEE transactions on industry applications, 2020)
Keywords: Circuit breakers; Circuit faults; Circuits; DC fault protection; Discrimination; Distributed generation; Fault detection; Field effect transistors; JFET; JFETs; Microgrids; Pulse width modulation; Radial distribution; Residential communities; Semiconductor devices; Sensors; Short circuits; Silicon carbide; Solid state; solid-state circuit breakers (SSCBs); Urban regeneration