Palaniappan, K., Sedano, W., Vygoder, M., Hoeft, N., Cuzner, R., & Shen, Z. J. (2020). Short-Circuit Fault Discrimination Using SiC JFET-Based Self-Powered Solid-State Circuit Breakers in a Residential DC Community Microgrid. IEEE transactions on industry applications, 56(4), 3466-3476. https://doi.org/10.1109/TIA.2020.2995114
Chicago Style (17th ed.) CitationPalaniappan, Karthik, Willy Sedano, Mark Vygoder, Nicholas Hoeft, Robert Cuzner, and Z. John Shen. "Short-Circuit Fault Discrimination Using SiC JFET-Based Self-Powered Solid-State Circuit Breakers in a Residential DC Community Microgrid." IEEE Transactions on Industry Applications 56, no. 4 (2020): 3466-3476. https://doi.org/10.1109/TIA.2020.2995114.
MLA (9th ed.) CitationPalaniappan, Karthik, et al. "Short-Circuit Fault Discrimination Using SiC JFET-Based Self-Powered Solid-State Circuit Breakers in a Residential DC Community Microgrid." IEEE Transactions on Industry Applications, vol. 56, no. 4, 2020, pp. 3466-3476, https://doi.org/10.1109/TIA.2020.2995114.