Fault Diagnosis in Photovoltaic Arrays Using GBSSL Method and Proposing a Fault Correction System

Nonlinear characteristics of solar cells and changes in environmental conditions, such as temperature, and in particular, the intensity of daytime irradiation, make it difficult to identify faults by the conventional means of protection. Therefore, a variety of machine learning techniques are propos...

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Published inIEEE transactions on industrial informatics Vol. 16; no. 8; pp. 5300 - 5308
Main Authors Momeni, Hosna, Sadoogi, Nasser, Farrokhifar, Meisam, Gharibeh, Hamed Farhadi
Format Journal Article
LanguageEnglish
Published Piscataway IEEE 01.08.2020
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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ISSN1551-3203
1941-0050
DOI10.1109/TII.2019.2908992

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Abstract Nonlinear characteristics of solar cells and changes in environmental conditions, such as temperature, and in particular, the intensity of daytime irradiation, make it difficult to identify faults by the conventional means of protection. Therefore, a variety of machine learning techniques are proposed for fault detection in photovoltaic (PV) arrays. In this regard, classifying and identifying the location of a fault event is essential. In addition to fault recognition, selecting the method of fault correction is another issue to be addressed. However, there are scarce investigations in this field. In this paper, a comprehensive method for identifying, classifying, locating, and correcting faults is introduced. The proposed method is assessed with the expansion of the diagnostic space of the graph-based semisupervised learning algorithm and an increased number of class labels. After identifying the type and location of a fault, the system temporarily isolates the fault to function without interruption until it is fully corrected. The problem of overlapping cell data in normal and fault-prone modes is resolved by applying different methods of normalization. The results show that all faults including unlearned and learned in a wide range of environmental conditions, where possible PV arrays are experienced, are properly identified and corrected. Moreover, our studies demonstrate that the proposed system mitigates the output voltage variations over a fault-prone mode.
AbstractList Nonlinear characteristics of solar cells and changes in environmental conditions, such as temperature, and in particular, the intensity of daytime irradiation, make it difficult to identify faults by the conventional means of protection. Therefore, a variety of machine learning techniques are proposed for fault detection in photovoltaic (PV) arrays. In this regard, classifying and identifying the location of a fault event is essential. In addition to fault recognition, selecting the method of fault correction is another issue to be addressed. However, there are scarce investigations in this field. In this paper, a comprehensive method for identifying, classifying, locating, and correcting faults is introduced. The proposed method is assessed with the expansion of the diagnostic space of the graph-based semisupervised learning algorithm and an increased number of class labels. After identifying the type and location of a fault, the system temporarily isolates the fault to function without interruption until it is fully corrected. The problem of overlapping cell data in normal and fault-prone modes is resolved by applying different methods of normalization. The results show that all faults including unlearned and learned in a wide range of environmental conditions, where possible PV arrays are experienced, are properly identified and corrected. Moreover, our studies demonstrate that the proposed system mitigates the output voltage variations over a fault-prone mode.
Author Momeni, Hosna
Farrokhifar, Meisam
Gharibeh, Hamed Farhadi
Sadoogi, Nasser
Author_xml – sequence: 1
  givenname: Hosna
  surname: Momeni
  fullname: Momeni, Hosna
  email: h.momeni@gmail.com
  organization: Faculty of Electrical and Computer Engineering, University of Tabriz, Tabriz, Iran
– sequence: 2
  givenname: Nasser
  surname: Sadoogi
  fullname: Sadoogi, Nasser
  email: sadoogi@tabrizu.ac.ir
  organization: R&D Department, Jam Hoor Tabriz Company, Tabriz, Iran
– sequence: 3
  givenname: Meisam
  orcidid: 0000-0003-2000-5960
  surname: Farrokhifar
  fullname: Farrokhifar, Meisam
  email: m.farrokhi@skoltech.ru
  organization: Center for Energy Science and Technology, Skolkovo Institute of Science and Technology, Moscow, Russia
– sequence: 4
  givenname: Hamed Farhadi
  surname: Gharibeh
  fullname: Gharibeh, Hamed Farhadi
  email: h_farhadi@sut.ac.ir
  organization: Faculty of Electrical Engineering, Sahand University of Technology, Tabriz, Iran
BookMark eNp9kM1PAjEQxRuDiYDeTbw08bw4_djt9ogoSIKRBDhvym4XSpYttsWE_97FJR48eJpJ5v3evLwe6tS21gjdExgQAvJpOZ0OKBA5oBJSKekV6hLJSQQQQ6fZ45hEjAK7QT3vdwBMAJNdpMbqWAX8YtSmtt54bGo839pgv2wVlMnx0Dl18njlTb3Bk-fFYobfddjaAqu6wHNnD_bnpHDrNLLO6TwYW-PFyQe9v0XXpaq8vrvMPlqNX5ejt2j2MZmOhrMop5KEiELJE5XmaczWXDDOpJQggCZUiJipnIkmcE41jeMCQPNUMcaLOBHluqHWgvXRY-t7cPbzqH3Idvbo6uZlRplMUsFFCo0qaVW5s947XWa5CeocNzhlqoxAdq4za-rMznVmlzobEP6AB2f2yp3-Qx5axGitf-VpkkIiOPsGvXyAWw
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ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2020
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2020
DBID 97E
RIA
RIE
AAYXX
CITATION
7SC
7SP
8FD
JQ2
L7M
L~C
L~D
DOI 10.1109/TII.2019.2908992
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005–Present
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Xplore
CrossRef
Computer and Information Systems Abstracts
Electronics & Communications Abstracts
Technology Research Database
ProQuest Computer Science Collection
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts – Academic
Computer and Information Systems Abstracts Professional
DatabaseTitle CrossRef
Technology Research Database
Computer and Information Systems Abstracts – Academic
Electronics & Communications Abstracts
ProQuest Computer Science Collection
Computer and Information Systems Abstracts
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts Professional
DatabaseTitleList
Technology Research Database
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Xplore
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1941-0050
EndPage 5308
ExternalDocumentID 10_1109_TII_2019_2908992
8680674
Genre orig-research
GroupedDBID 0R~
29I
4.4
5GY
5VS
6IK
97E
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFS
ACIWK
AENEX
AETIX
AGQYO
AGSQL
AHBIQ
AKJIK
AKQYR
ALMA_UNASSIGNED_HOLDINGS
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
HZ~
IFIPE
IPLJI
JAVBF
LAI
M43
O9-
OCL
P2P
RIA
RIE
RNS
AAYXX
CITATION
7SC
7SP
8FD
JQ2
L7M
L~C
L~D
ID FETCH-LOGICAL-c291t-20f46a8c853b473439990702627753ac37703c2e255d00e48a334d567fba8cb73
IEDL.DBID RIE
ISSN 1551-3203
IngestDate Mon Jun 30 10:16:02 EDT 2025
Thu Apr 24 23:07:13 EDT 2025
Wed Oct 01 03:40:10 EDT 2025
Wed Aug 27 02:43:22 EDT 2025
IsPeerReviewed false
IsScholarly true
Issue 8
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
https://doi.org/10.15223/policy-029
https://doi.org/10.15223/policy-037
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c291t-20f46a8c853b473439990702627753ac37703c2e255d00e48a334d567fba8cb73
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ORCID 0000-0003-2000-5960
PQID 2396874780
PQPubID 85507
PageCount 9
ParticipantIDs crossref_primary_10_1109_TII_2019_2908992
proquest_journals_2396874780
crossref_citationtrail_10_1109_TII_2019_2908992
ieee_primary_8680674
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2020-08-01
PublicationDateYYYYMMDD 2020-08-01
PublicationDate_xml – month: 08
  year: 2020
  text: 2020-08-01
  day: 01
PublicationDecade 2020
PublicationPlace Piscataway
PublicationPlace_xml – name: Piscataway
PublicationTitle IEEE transactions on industrial informatics
PublicationTitleAbbrev TII
PublicationYear 2020
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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SSID ssj0037039
Score 2.5047002
Snippet Nonlinear characteristics of solar cells and changes in environmental conditions, such as temperature, and in particular, the intensity of daytime irradiation,...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 5300
SubjectTerms Algorithms
Arrays
Circuit faults
Classification
Classification algorithms
Diagnostic systems
Fault classification
fault correction
Fault detection
Fault diagnosis
Fault location
Informatics
Machine learning
Photovoltaic cells
Solar cells
solar photovoltaic (PV) arrays
Support vector machines
Symmetric matrices
Title Fault Diagnosis in Photovoltaic Arrays Using GBSSL Method and Proposing a Fault Correction System
URI https://ieeexplore.ieee.org/document/8680674
https://www.proquest.com/docview/2396874780
Volume 16
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVIEE
  databaseName: IEEE Xplore
  customDbUrl:
  eissn: 1941-0050
  dateEnd: 99991231
  omitProxy: false
  ssIdentifier: ssj0037039
  issn: 1551-3203
  databaseCode: RIE
  dateStart: 20050101
  isFulltext: true
  titleUrlDefault: https://ieeexplore.ieee.org/
  providerName: IEEE
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LT-MwEB4BJzgsb215yQcuK5HW-BXnyKs8tEVIgMQtcmxXWy1KEU0P8OsZO0m1CwhxixRPZPkbz3jimfkA9plnzjPBcaexIhGO6gS1hCXoyU3GjSyoCdXIg2t1cS-uHuTDHBzMamG89zH5zHfDY7zLd2M7Db_KelppNK5iHuZTrepardbqctTcLPZGlYcJZ5S3V5I0691dXoYcrqzL4iUX-88FRU6VD4Y4epf-MgzaedVJJX-706ro2td3LRu_O_EV-NEcM8lRrRerMOfLNVj6p_ngOpi-mT5W5LTOtRtNyKgkN3_G1RgNVmVGFoWfzcuExKQCcn58e_ubDCLfNDGlIzeBXiG-MqT-0kkg-ohlEqTug74B9_2zu5OLpCFcSCzLDivcMUOhjLbowguR8hCqYOyMURpLMaoxlqe4yhbhldJR6oU2nAsnVTosUKpI-SYslOPS_wTieSqNNlQxlwpPpXbMOquUdJkfGlN0oNdikNumG3kgxXjMY1RCsxxRywNqeYNaB37NJJ7qThxfjF0PIMzGNevfgZ0W5rzZqpOc8UzpwCJAtz6X2oZFFoLsmPW3AwvV89Tv4kmkKvaiCr4Bxa3YcA
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LbxMxEB6VcCgcgDatCE3Bh14qdRPHj30cS2hIaFJVaiL1tvLajoiINijZHODXM_buRvQhxG2l9awsf-MZz3pmPoAzZpmxTHDcaSwLhKFxgFrCAvTkKuFKZlS5auTJTTiciW_38n4PLna1MNZan3xmO-7R3-Wbld66X2XdOIzRuIoX8FIKIWRZrVXbXY66m_juqLIXcEZ5fSlJk-50NHJZXEmH-Wsu9sAJeVaVJ6bY-5fBW5jUMyvTSn50tkXW0b8fNW3836m_gzfVQZNclppxAHs2P4TXf7UfbIIaqO2yIF_KbLvFhixycvt9VazQZBVqoVF4rX5tiE8rIF8_392NycQzThOVG3LrCBb8K0XKL_Ud1YcvlCBlJ_QjmA2upv1hUFEuBJolvQL3zFyEKtboxDMRcResYPSMcRqLMK5Rmke4yhoBltJQakWsOBdGhtE8Q6ks4sfQyFe5fQ_E8kiqWNGQmUhYKmPDtNFhKE1i50plLejWGKS66kfuaDGWqY9LaJIiaqlDLa1Qa8H5TuJn2YvjH2ObDoTduGr9W9CuYU6rzbpJGU_C2PEI0A_PS32C_eF0Mk7Ho5vrE3jFXMjtcwDb0CjWW3uK55Ii--jV8Q9FMdu9
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Fault+Diagnosis+in+Photovoltaic+Arrays+Using+GBSSL+Method+and+Proposing+a+Fault+Correction+System&rft.jtitle=IEEE+transactions+on+industrial+informatics&rft.au=Momeni%2C+Hosna&rft.au=Sadoogi%2C+Nasser&rft.au=Farrokhifar%2C+Meisam&rft.au=Gharibeh%2C+Hamed+Farhadi&rft.date=2020-08-01&rft.issn=1551-3203&rft.eissn=1941-0050&rft.volume=16&rft.issue=8&rft.spage=5300&rft.epage=5308&rft_id=info:doi/10.1109%2FTII.2019.2908992&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_TII_2019_2908992
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1551-3203&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1551-3203&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1551-3203&client=summon