APA (7th ed.) Citation

Lindquist, M., Roblin, P., Mikrut, D., Nichols, M. J., & Miller, N. C. (2024). Isothermal Characterization of Traps in GaN HEMTs Operating in Class B Using a Real-Time Pulsed-RF NVNA Testbed. IEEE transactions on microwave theory and techniques, 72(10), 5872-5887. https://doi.org/10.1109/TMTT.2024.3387898

Chicago Style (17th ed.) Citation

Lindquist, Miles, Patrick Roblin, Dominic Mikrut, Matthew J. Nichols, and Nicholas C. Miller. "Isothermal Characterization of Traps in GaN HEMTs Operating in Class B Using a Real-Time Pulsed-RF NVNA Testbed." IEEE Transactions on Microwave Theory and Techniques 72, no. 10 (2024): 5872-5887. https://doi.org/10.1109/TMTT.2024.3387898.

MLA (9th ed.) Citation

Lindquist, Miles, et al. "Isothermal Characterization of Traps in GaN HEMTs Operating in Class B Using a Real-Time Pulsed-RF NVNA Testbed." IEEE Transactions on Microwave Theory and Techniques, vol. 72, no. 10, 2024, pp. 5872-5887, https://doi.org/10.1109/TMTT.2024.3387898.