SOT-MRAM Digital PIM Architecture With Extended Parallelism in Matrix Multiplication
Emerging device-based digital processing-in-memory (PIM) architectures have been actively studied due to their energy and area efficiency derived from analog to digital converter (ADC)-less PIM hardware. However, digital PIM architectures generally need large extra memories to copy parameters, and t...
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Published in | IEEE transactions on computers Vol. 71; no. 11; pp. 2816 - 2828 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.11.2022
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
ISSN | 0018-9340 1557-9956 |
DOI | 10.1109/TC.2022.3155277 |
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Abstract | Emerging device-based digital processing-in-memory (PIM) architectures have been actively studied due to their energy and area efficiency derived from analog to digital converter (ADC)-less PIM hardware. However, digital PIM architectures generally need large extra memories to copy parameters, and they also suffer from low computation per memory-cycle efficiencies. In this paper, we present a novel spin-orbit torque magnetic random access memory (SOT-MRAM) based digital PIM architecture to alleviate the extra memory size burden and computation cycle issues. First, we propose the spintronics-assisted logic-in-memory (SLIM) cells to support efficient digital logic operations inside memories, where the voltage-controlled magnetic anisotropy (VCMA) is exploited to enhance the computation per memory-cycle efficiencies. In addition, crossed input source PIM (CRISP) architecture is proposed to extend the merits of SLIM cells by eliminating the extra memories for parameter copying while significantly improving the degree of parallel processing. An intra-memory pipelining scheme is also considered to further increase the throughput of CRISP. The proposed CRISP architecture has been implemented using 28 nm CMOS process, and it presents 1.10 TOPS/W and 0.95 TOPS/mm 2 , showing considerable improvements of energy efficiency and throughput per area, compared to the state-of-the-art digital PIM architecture. Finally, to evaluate the impact of computation errors induced from the SOT devices and circuits in CRISP architecture, classification accuracy simulations have been performed while applying computation errors. |
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AbstractList | Emerging device-based digital processing-in-memory (PIM) architectures have been actively studied due to their energy and area efficiency derived from analog to digital converter (ADC)-less PIM hardware. However, digital PIM architectures generally need large extra memories to copy parameters, and they also suffer from low computation per memory-cycle efficiencies. In this paper, we present a novel spin-orbit torque magnetic random access memory (SOT-MRAM) based digital PIM architecture to alleviate the extra memory size burden and computation cycle issues. First, we propose the spintronics-assisted logic-in-memory (SLIM) cells to support efficient digital logic operations inside memories, where the voltage-controlled magnetic anisotropy (VCMA) is exploited to enhance the computation per memory-cycle efficiencies. In addition, crossed input source PIM (CRISP) architecture is proposed to extend the merits of SLIM cells by eliminating the extra memories for parameter copying while significantly improving the degree of parallel processing. An intra-memory pipelining scheme is also considered to further increase the throughput of CRISP. The proposed CRISP architecture has been implemented using 28 nm CMOS process, and it presents 1.10 TOPS/W and 0.95 TOPS/mm 2 , showing considerable improvements of energy efficiency and throughput per area, compared to the state-of-the-art digital PIM architecture. Finally, to evaluate the impact of computation errors induced from the SOT devices and circuits in CRISP architecture, classification accuracy simulations have been performed while applying computation errors. Emerging device-based digital processing-in-memory (PIM) architectures have been actively studied due to their energy and area efficiency derived from analog to digital converter (ADC)-less PIM hardware. However, digital PIM architectures generally need large extra memories to copy parameters, and they also suffer from low computation per memory-cycle efficiencies. In this paper, we present a novel spin-orbit torque magnetic random access memory (SOT-MRAM) based digital PIM architecture to alleviate the extra memory size burden and computation cycle issues. First, we propose the spintronics-assisted logic-in-memory (SLIM) cells to support efficient digital logic operations inside memories, where the voltage-controlled magnetic anisotropy (VCMA) is exploited to enhance the computation per memory-cycle efficiencies. In addition, crossed input source PIM (CRISP) architecture is proposed to extend the merits of SLIM cells by eliminating the extra memories for parameter copying while significantly improving the degree of parallel processing. An intra-memory pipelining scheme is also considered to further increase the throughput of CRISP. The proposed CRISP architecture has been implemented using 28 nm CMOS process, and it presents 1.10 TOPS/W and 0.95 TOPS/mm2, showing considerable improvements of energy efficiency and throughput per area, compared to the state-of-the-art digital PIM architecture. Finally, to evaluate the impact of computation errors induced from the SOT devices and circuits in CRISP architecture, classification accuracy simulations have been performed while applying computation errors. |
Author | Kim, Taehwan Kang, Min-Gu Park, Jongsun Lee, Kyung-Jin Park, Byong-Guk Jang, Yunho |
Author_xml | – sequence: 1 givenname: Taehwan surname: Kim fullname: Kim, Taehwan email: toto9900@korea.ac.kr organization: School of Electrical Engineering, Korea University, Seoul, Korea – sequence: 2 givenname: Yunho orcidid: 0000-0002-5848-1287 surname: Jang fullname: Jang, Yunho email: yunho3469@korea.ac.kr organization: School of Electrical Engineering, Korea University, Seoul, Korea – sequence: 3 givenname: Min-Gu surname: Kang fullname: Kang, Min-Gu email: mingu@kaist.ac.kr organization: Department of Materials Science and Engineering, KAIST, Daejeon, Korea – sequence: 4 givenname: Byong-Guk orcidid: 0000-0001-8813-7025 surname: Park fullname: Park, Byong-Guk email: bgpark@kaist.ac.kr organization: Department of Materials Science and Engineering, KAIST, Daejeon, Korea – sequence: 5 givenname: Kyung-Jin orcidid: 0000-0001-6269-2266 surname: Lee fullname: Lee, Kyung-Jin email: kjlee@kaist.ac.kr organization: Department of Physics, KAIST, Daejeon, Korea – sequence: 6 givenname: Jongsun orcidid: 0000-0003-3251-0024 surname: Park fullname: Park, Jongsun email: jongsun@korea.ac.kr organization: School of Electrical Engineering, Korea University, Seoul, Korea |
BookMark | eNp9kM1PwjAYhxujiYCePXhp4nnQj3VdjwRRSVggOuOx6bpOSsqGXZfgf-8IxIMHT-97eJ734zcEl3VTGwDuMBpjjMQkn40JImRMMWOE8wsw6BseCcGSSzBACKeRoDG6BsO23SKEEoLEAORvqzzKXqcZfLSfNigH14sMTr3e2GB06LyBHzZs4PwQTF2aEq6VV84ZZ9sdtDXMVPD2ALPOBbt3Vqtgm_oGXFXKteb2XEfg_Wmez16i5ep5MZsuI01SEaJUJ0WCS6ZTlmqeJlyxQgihcKkKwQiq4sQUJRclo1jpJK0oVwoVVJVamwJVdAQeTnP3vvnqTBvktul83a-UhBMqEIo57yl2orRv2tabSur-0eOdwSvrJEbyGKDMZ_IYoDwH2HuTP97e253y3_8Y9yfDGmN-acGJiBmmP_FsfI0 |
CODEN | ITCOB4 |
CitedBy_id | crossref_primary_10_3233_JIFS_223898 crossref_primary_10_1109_TCAD_2024_3371268 crossref_primary_10_1109_TCSI_2023_3254607 crossref_primary_10_1109_TED_2024_3423812 crossref_primary_10_1103_PhysRevApplied_23_014071 crossref_primary_10_1109_TCSI_2024_3395442 crossref_primary_10_1145_3650729 crossref_primary_10_3390_electronics12204223 crossref_primary_10_1016_j_chip_2025_100134 crossref_primary_10_1109_TCAD_2023_3330819 crossref_primary_10_1109_TETC_2022_3214833 |
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ContentType | Journal Article |
Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2022 |
Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2022 |
DBID | 97E RIA RIE AAYXX CITATION 7SC 7SP 8FD JQ2 L7M L~C L~D |
DOI | 10.1109/TC.2022.3155277 |
DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005–Present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE/IET Electronic Library CrossRef Computer and Information Systems Abstracts Electronics & Communications Abstracts Technology Research Database ProQuest Computer Science Collection Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Academic Computer and Information Systems Abstracts Professional |
DatabaseTitle | CrossRef Technology Research Database Computer and Information Systems Abstracts – Academic Electronics & Communications Abstracts ProQuest Computer Science Collection Computer and Information Systems Abstracts Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Professional |
DatabaseTitleList | Technology Research Database |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Computer Science |
EISSN | 1557-9956 |
EndPage | 2828 |
ExternalDocumentID | 10_1109_TC_2022_3155277 9729451 |
Genre | orig-research |
GrantInformation_xml | – fundername: Samsung; Samsung Electronics grantid: SRFC-MA1802-01 funderid: 10.13039/100004358 |
GroupedDBID | --Z -DZ -~X .DC 0R~ 29I 4.4 5GY 6IK 85S 97E AAJGR AARMG AASAJ AAWTH ABAZT ABQJQ ABVLG ACGFO ACIWK ACNCT AENEX AETEA AGQYO AHBIQ AKJIK AKQYR ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD HZ~ IEDLZ IFIPE IPLJI JAVBF LAI M43 MS~ O9- OCL P2P PQQKQ RIA RIE RNS RXW TAE TN5 TWZ UHB UPT XZL YZZ AAYXX CITATION 7SC 7SP 8FD JQ2 L7M L~C L~D |
ID | FETCH-LOGICAL-c289t-8c6b61d5c858c7867a5b999a1dab9520f46ebd79d531ac68f37aa0b3adcceb0f3 |
IEDL.DBID | RIE |
ISSN | 0018-9340 |
IngestDate | Mon Jun 30 04:45:52 EDT 2025 Tue Jul 01 00:27:41 EDT 2025 Thu Apr 24 22:54:57 EDT 2025 Wed Aug 27 02:18:43 EDT 2025 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 11 |
Language | English |
License | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html https://doi.org/10.15223/policy-029 https://doi.org/10.15223/policy-037 |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c289t-8c6b61d5c858c7867a5b999a1dab9520f46ebd79d531ac68f37aa0b3adcceb0f3 |
Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 |
ORCID | 0000-0001-6269-2266 0000-0002-5848-1287 0000-0003-3251-0024 0000-0001-8813-7025 |
PQID | 2723900477 |
PQPubID | 85452 |
PageCount | 13 |
ParticipantIDs | crossref_citationtrail_10_1109_TC_2022_3155277 proquest_journals_2723900477 ieee_primary_9729451 crossref_primary_10_1109_TC_2022_3155277 |
ProviderPackageCode | CITATION AAYXX |
PublicationCentury | 2000 |
PublicationDate | 2022-11-01 |
PublicationDateYYYYMMDD | 2022-11-01 |
PublicationDate_xml | – month: 11 year: 2022 text: 2022-11-01 day: 01 |
PublicationDecade | 2020 |
PublicationPlace | New York |
PublicationPlace_xml | – name: New York |
PublicationTitle | IEEE transactions on computers |
PublicationTitleAbbrev | TC |
PublicationYear | 2022 |
Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
References | ref13 ref12 ref15 ref14 ref11 ref10 ref2 Simonyan (ref21) 2015 ref1 ref17 ref16 ref19 ref18 ref24 ref23 ref26 ref25 ref20 ref22 ref28 ref27 ref8 ref7 ref9 ref4 ref3 ref6 ref5 |
References_xml | – ident: ref3 doi: 10.1145/3218603.3218654 – ident: ref7 doi: 10.1109/DAC18072.2020.9218673 – ident: ref26 doi: 10.23919/DATE.2018.8342229 – ident: ref14 doi: 10.1038/s41928-018-0099-8 – ident: ref6 doi: 10.1145/3357250 – ident: ref15 doi: 10.1109/JXCDC.2019.2951157 – ident: ref11 doi: 10.1109/JETCAS.2016.2547681 – ident: ref27 doi: 10.1109/TCAD.2019.2907886 – ident: ref13 doi: 10.1109/TED.2017.2726544 – ident: ref9 doi: 10.1109/ISCAS.2018.8351561 – ident: ref1 doi: 10.1109/ISCA.2016.12 – ident: ref10 doi: 10.1109/JXCDC.2017.2762699 – ident: ref2 doi: 10.1145/3195970.3195998 – ident: ref28 doi: 10.1109/ISCAS45731.2020.9181022 – ident: ref22 doi: 10.1109/IEDM.2016.7838491 – ident: ref25 doi: 10.1109/CVPR.2018.00474 – ident: ref16 doi: 10.1109/TC.2010.103 – year: 2015 ident: ref21 article-title: Very deep convolutional networks for large-scale image recognition – ident: ref24 doi: 10.1109/CVPR.2016.90 – ident: ref23 doi: 10.1063/1.4866186 – ident: ref5 doi: 10.1109/TC.2018.2858251 – ident: ref12 doi: 10.1109/TMAG.2015.2443124 – ident: ref18 doi: 10.1109/CICC.2015.7338407 – ident: ref8 doi: 10.1109/JSSC.2016.2616357 – ident: ref17 doi: 10.1109/DATE.2012.6176595 – ident: ref4 doi: 10.1145/3307650.3322237 – ident: ref19 doi: 10.1109/TED.2014.2377721 – ident: ref20 doi: 10.1109/LED.2016.2578959 |
SSID | ssj0006209 |
Score | 2.4467251 |
Snippet | Emerging device-based digital processing-in-memory (PIM) architectures have been actively studied due to their energy and area efficiency derived from analog... |
SourceID | proquest crossref ieee |
SourceType | Aggregation Database Enrichment Source Index Database Publisher |
StartPage | 2816 |
SubjectTerms | Analog to digital converters CNN Accelerator Computational efficiency Computer architecture Copying digital processing in-memory Errors Hardware In-memory computing Logic gates Magnetic anisotropy Magnetic tunneling Memory management Multiplication Parallel processing Parameters Performance evaluation Pipelining (computers) Random access memory Spintronics Switches Throughput VCMA effect |
Title | SOT-MRAM Digital PIM Architecture With Extended Parallelism in Matrix Multiplication |
URI | https://ieeexplore.ieee.org/document/9729451 https://www.proquest.com/docview/2723900477 |
Volume | 71 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LTwIxEJ4gJz2IgkYUTQ8ePLiw7-0eCULQZJXoErlt-kKJCAaWxPjrbXe7BF-Jtz20TbPfTDsznfkG4BwrHidMiMGYyQ3XlX4KFjY3iGVRH-NxILJC4ejW7w_dm5E3KsHluhZGCJEln4mm-sze8vmcrVSorBVKS9BV9dJbUszyWq31qesX6RyWVGDHNTWNj2WGrbgj_UDblu6pohsLvtxAWUuVH-dwdrn0KhAV28pzSl6aq5Q22cc3xsb_7nsPdrWVidq5WOxDScyqUCk6OCCt0FXY2aAjrEH8cBcb0X07QleTJ9VMBA2uI9TeeGpAj5P0GXV14BwNyEK1YplOlq9oMkORovt_R1Geo6iDgQcw7HXjTt_QXRcMJp2v1MDMp77FPYY9zALsB8Sj0ookFic09Gxz7PqC8iDkUnsJ8_HYCQgxqUM4Y4KaY-cQyrP5TBwBIrbrcanhLuPSj2RE_gQuTSzBQi7NBhvXoVkgkTBNSa46Y0yTzDUxwyTuJAq6RENXh4v1hLecjePvoTUFxHqYxqAOjQLqRGvrMrED2wkVb2Zw_PusE9hWa-c1iA0op4uVOJXGSErPMin8BO8p2ko |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3JTsMwEB1VcAAOLC2IsvrAgQMp2eMcq0JVoCkVBMEt8haoKC0qqYT4euzEqcomccvBlq08jz3PnnkDcISVjhMmxGDM5IbrSp6Chc0NYlnUxzgNRJ4oHPX8zp17-eA9VOBklgsjhMiDz0RDfeZv-XzMpuqq7DSUnqCr8qUXPckqcJGtNdt3_TKgw5Im7LimFvKxzPA0bkkmaNuSoCrBseDLGZQXVfmxE-fHS3sNonJiRVTJc2Oa0Qb7-KbZ-N-Zr8Oq9jNRs1gYG1ARoyqslTUckDbpKqzMCRLWIL69jo3ophmhs8GjKieC-hcRas49NqD7QfaEzvXVOeqTiSrGMhy8vaDBCEVK8P8dRUWUor4O3IS79nnc6hi67oLBJP3KDMx86lvcY9jDLMB-QDwq_UhicUJDzzZT1xeUByGX9kuYj1MnIMSkDuGMCWqmzhYsjMYjsQ2I2K7HpY27jEsmyYj8CVw6WYKFXDoONq5Do0QiYVqUXNXGGCY5OTHDJG4lCrpEQ1eH41mH10KP4--mNQXErJnGoA57JdSJtte3xA5sJ1TKmcHO770OYakTR92ke9G72oVlNU6RkbgHC9lkKvala5LRg3xFfgKWrt2d |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=SOT-MRAM+Digital+PIM+Architecture+With+Extended+Parallelism+in+Matrix+Multiplication&rft.jtitle=IEEE+transactions+on+computers&rft.au=Kim%2C+Taehwan&rft.au=Jang%2C+Yunho&rft.au=Kang%2C+Min-Gu&rft.au=Park%2C+Byong-Guk&rft.date=2022-11-01&rft.issn=0018-9340&rft.eissn=1557-9956&rft.volume=71&rft.issue=11&rft.spage=2816&rft.epage=2828&rft_id=info:doi/10.1109%2FTC.2022.3155277&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_TC_2022_3155277 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9340&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9340&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9340&client=summon |