Defect dynamics in the presence of excess energetic carriers and high electric fields in wide-gap semiconductors - O’Hara, Andrew; Schrimpf, Ronald D.; Fleetwood, Daniel M.; Pantelides, Sokrates T. (Journal of applied physics, 2024)
Keywords: Breakdown; Conduction; Defects; Degradation; Density functional theory; Electric fields; Electron beams; Failure; Heavy ions; Ionizing radiation; Nanowires; Semiconductors; Single Event Effects