Contrast‐enhanced, single‐shot LED array microscopy based on Fourier ptychographic algorithm and deep learning - Wang, Shengping; Zhang, Zibang; Yao, Manhong; Deng, Zihao; Peng, Junzheng; Zhong, Jingang (Journal of microscopy (Oxford), 2023)
Keywords: Aberration; Algorithms; Arrays; Artificial neural networks; Deep learning; Illumination; Image acquisition; Image contrast; Image reconstruction; Machine learning; Microscopes; Microscopy; Neural networks; Numerical aperture; Spatial discrimination; Spatial resolution; Tradeoffs