Phase Transformation and Enhancing Electron Field Emission Properties in Microcrystalline Diamond Films Induced by Cu Ion Implantation and Rapid Annealing
Cu ion implantation and subsequent rapid annealing at 500℃ in N2 result in low surface resistivity of 1.611 ohm/sq with high mobility of 290 cm2 V-1S-1 for microcrystalline diamond (MCD) films. Its electrical field emission behavior can be turned on at Eo = 2.6 V/μm, attaining a current density of 1...
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| Published in | Chinese physics letters Vol. 33; no. 8; pp. 123 - 126 |
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| Main Author | |
| Format | Journal Article |
| Language | English |
| Published |
01.08.2016
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| Subjects | |
| Online Access | Get full text |
| ISSN | 0256-307X 1741-3540 |
| DOI | 10.1088/0256-307X/33/8/088101 |
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| Abstract | Cu ion implantation and subsequent rapid annealing at 500℃ in N2 result in low surface resistivity of 1.611 ohm/sq with high mobility of 290 cm2 V-1S-1 for microcrystalline diamond (MCD) films. Its electrical field emission behavior can be turned on at Eo = 2.6 V/μm, attaining a current density of 19.5μA/cm2 at an applied field of 3.5 V/#m. Field emission scanning electron microscopy combined with Raman and x-ray photoelectron mi- croscopy reveal that the formation of Cu nanoparticles in MCD films can catalytically convert the less conducting disorder/a-C phases into graphitic phases and can provoke the formation of nanographite in the films, forming conduction channels for electron transportation. |
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| AbstractList | Cu ion implantation and subsequent rapid annealing at 500℃ in N2 result in low surface resistivity of 1.611 ohm/sq with high mobility of 290 cm2 V-1S-1 for microcrystalline diamond (MCD) films. Its electrical field emission behavior can be turned on at Eo = 2.6 V/μm, attaining a current density of 19.5μA/cm2 at an applied field of 3.5 V/#m. Field emission scanning electron microscopy combined with Raman and x-ray photoelectron mi- croscopy reveal that the formation of Cu nanoparticles in MCD films can catalytically convert the less conducting disorder/a-C phases into graphitic phases and can provoke the formation of nanographite in the films, forming conduction channels for electron transportation. |
| Author | 申艳艳 张一新 祁婷 乔瑜 贾钰欣 黑鸿君 贺志勇 于盛旺 |
| AuthorAffiliation | Research Institute of Surface Engineering, Taiyuan University of Technology, Taiyuan 030024 |
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| Cites_doi | 10.1016/j.apsusc.2011.05.108 10.1063/1.4770513 10.1146/annurev.matsci.29.1.211 10.1063/1.1564880 10.1103/PhysRevB.74.235434 10.1103/PhysRevB.80.165321 10.1103/PhysRevB.75.195431 10.1063/1.3556741 10.1103/PhysRevB.61.14095 10.1088/0957-4484/17/1/052 10.1016/j.matlet.2014.10.119 10.1103/PhysRevB.74.155429 |
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| Notes | Cu ion implantation and subsequent rapid annealing at 500℃ in N2 result in low surface resistivity of 1.611 ohm/sq with high mobility of 290 cm2 V-1S-1 for microcrystalline diamond (MCD) films. Its electrical field emission behavior can be turned on at Eo = 2.6 V/μm, attaining a current density of 19.5μA/cm2 at an applied field of 3.5 V/#m. Field emission scanning electron microscopy combined with Raman and x-ray photoelectron mi- croscopy reveal that the formation of Cu nanoparticles in MCD films can catalytically convert the less conducting disorder/a-C phases into graphitic phases and can provoke the formation of nanographite in the films, forming conduction channels for electron transportation. 11-1959/O4 |
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| References | 12 13 14 16 17 Lv F X (2) 2003; 32 1 Talapatra S (8) 2006; 17 3 Zhu L L (9) 2015; 24 4 5 6 7 Zhang H (10) 2014; 23 Zeng L (11) 2014; 31 Wang R Z (15) 2002; 31 |
| References_xml | – ident: 16 doi: 10.1016/j.apsusc.2011.05.108 – ident: 5 doi: 10.1063/1.4770513 – volume: 24 issn: 1674-1056 year: 2015 ident: 9 publication-title: Chin. Phys. – volume: 32 start-page: 383 year: 2003 ident: 2 publication-title: Physics – ident: 4 doi: 10.1146/annurev.matsci.29.1.211 – ident: 6 doi: 10.1063/1.1564880 – ident: 3 doi: 10.1103/PhysRevB.74.235434 – ident: 1 doi: 10.1103/PhysRevB.80.165321 – ident: 7 doi: 10.1103/PhysRevB.75.195431 – ident: 13 doi: 10.1063/1.3556741 – volume: 23 issn: 1674-1056 year: 2014 ident: 10 publication-title: Chin. Phys. – volume: 31 issn: 0256-307X year: 2014 ident: 11 publication-title: Chin. Phys. Lett. – ident: 17 doi: 10.1103/PhysRevB.61.14095 – volume: 17 start-page: 305 issn: 0957-4484 year: 2006 ident: 8 publication-title: Nanotechnology doi: 10.1088/0957-4484/17/1/052 – volume: 31 start-page: 84 year: 2002 ident: 15 publication-title: Physics – ident: 12 doi: 10.1016/j.matlet.2014.10.119 – ident: 14 doi: 10.1103/PhysRevB.74.155429 |
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| Snippet | Cu ion implantation and subsequent rapid annealing at 500℃ in N2 result in low surface resistivity of 1.611 ohm/sq with high mobility of 290 cm2 V-1S-1 for... |
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| SubjectTerms | 场发射扫描电子显微镜 微晶金刚石 快速退火 电子场发射性能 相变 诱导 金刚石薄膜 铜离子注入 |
| Title | Phase Transformation and Enhancing Electron Field Emission Properties in Microcrystalline Diamond Films Induced by Cu Ion Implantation and Rapid Annealing |
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