Diagnosis algorithms for a reconfigurable and defect tolerant JTAG scan chain in large area integrated circuits - Berrima, Safa; Blaquière, Yves; Savaria, Yvon (Integration (Amsterdam), 2018)
Keywords: Algorithms; Chains; Defect tolerance; Defect tolerant scan chain; Defects; Diagnosis; Integrated circuits; Large area integrated circuit (LAIC); Reconfiguration; Search algorithms; Defect tolerance; Diagnosis; Large area integrated circuit (LAIC); Defect tolerant scan chain