Scanning probe microscopy - Bian, Ke; Gerber, Christoph; Heinrich, Andreas J; Müller, Daniel J; Scheuring, Simon; Jiang, Ying (Nature Reviews Methods Primers, 2021)
Keywords: Atomic force microscopy; Data analysis; Electric fields; Electric noise; Electrons; Laboratories; Magnetic properties; Materials science; Mechanical properties; Microscopy; Optical properties; Physical sciences; Raster scanning; Reproducibility; Scanners; Scanning probe microscopy; Scanning tunneling microscopy; Spectroscopy; Vibration