A Computerized System for the Measurement of Nanomaterial Field Emission and Ionization

We have developed a computerized system for measuring field electron emission （FE） and field ionization （FI）, which has a three-electrode configuration with emitters biased up to 25 kV, and is programmed by the Labview software. The current-voltage curves of nano-tip tungsten and carbon nanotube （CN...

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Published inPlasma science & technology Vol. 14; no. 9; pp. 819 - 823
Main Author 王泽松 张早娣 何俊 李载春 刘传胜 吴先映 付德君
Format Journal Article
LanguageEnglish
Published 01.09.2012
Subjects
Labview
场发射
场电离
场致电子发射
扫描电子显微镜
测量
纳米材料
计算机系统
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ISSN1009-0630
DOI10.1088/1009-0630/14/9/09

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Summary:We have developed a computerized system for measuring field electron emission （FE） and field ionization （FI）, which has a three-electrode configuration with emitters biased up to 25 kV, and is programmed by the Labview software. The current-voltage curves of nano-tip tungsten and carbon nanotube （CNT） arrays were measured. The electron emission of CNTs proceeded with a turn-on field of 1.24 V/μm and a threshold field of 1.85 V/μm. Compared to the field emission, field ionization turned on at 3.5 V/μm. Raman spectroscopy and scanning electron microscopy （SEM） measurements showed degradation of the CNTs after FE/FI testing. The measurement of a W-tip revealed strong electron emission and instability behavior at a field strength higher than 7.0 V/μm.
Bibliography:WANG Zesong , ZHANG Zaodi , HE Jun , LEE Jae Choon , LIU Chuansheng , WU Xianying , FU Dejun 1Accelerator Laboratory, School of Physics and Technology, Wuhan University, Wuhan 430072, China 2Key Laboratory of Beam Technology and Material Modification of Ministry of Education, Beijing Normal University, Beijing, 100875, China 3Quantum-Functional Semiconductor Research Center, Dongguk University, Seoul, 100-715, Korea 4Department of Physics, Three Gorges University, Yichang 443000, China
We have developed a computerized system for measuring field electron emission （FE） and field ionization （FI）, which has a three-electrode configuration with emitters biased up to 25 kV, and is programmed by the Labview software. The current-voltage curves of nano-tip tungsten and carbon nanotube （CNT） arrays were measured. The electron emission of CNTs proceeded with a turn-on field of 1.24 V/μm and a threshold field of 1.85 V/μm. Compared to the field emission, field ionization turned on at 3.5 V/μm. Raman spectroscopy and scanning electron microscopy （SEM） measurements showed degradation of the CNTs after FE/FI testing. The measurement of a W-tip revealed strong electron emission and instability behavior at a field strength higher than 7.0 V/μm.
34-1187/TL
field emission, field ionization, measuring system, nano materials
ISSN:1009-0630
DOI:10.1088/1009-0630/14/9/09