Zajusz, M., Tkacz-Śmiech, K., Bożek, B., & Danielewski, M. (2016). On the Consistency of the Darken Method with the Onsager Representation for Diffusion in Multicomponent Systems. Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum, 369, 53-58. https://doi.org/10.4028/www.scientific.net/DDF.369.53
Chicago Style (17th ed.) CitationZajusz, Marek, Katarzyna Tkacz-Śmiech, Bogusław Bożek, and Marek Danielewski. "On the Consistency of the Darken Method with the Onsager Representation for Diffusion in Multicomponent Systems." Diffusion and Defect Data. Solid State Data. Pt. A, Defect and Diffusion Forum 369 (2016): 53-58. https://doi.org/10.4028/www.scientific.net/DDF.369.53.
MLA (9th ed.) CitationZajusz, Marek, et al. "On the Consistency of the Darken Method with the Onsager Representation for Diffusion in Multicomponent Systems." Diffusion and Defect Data. Solid State Data. Pt. A, Defect and Diffusion Forum, vol. 369, 2016, pp. 53-58, https://doi.org/10.4028/www.scientific.net/DDF.369.53.