Hot-carrier effects on irradiated deep submicron NMOSFET - 崔江维 郑齐文 余学峰 丛忠超 周航 郭旗 文林 魏莹 任迪远 (Journal of semiconductors, 2014)
Keywords: Channels; Charge; Degradation; Devices; Electric charge; Ionization; Irradiation; NMOSFET; NMOS器件; Semiconductors; 几何形状; 深亚微米; 热载流子效应; 热载流子退化; 辐照; 陷阱电荷