A New Algorithm for Fault Tolerance in Redundant Sensor Systems Based on Real-Time Variance Estimation

Low cost and small size integrated sensors bring a significant interest to redundant sensing systems such as sensor array systems. Redundancy may permit to increase both performance and dependability of individual sensors at the system level, however, the emergence of these redundant systems has gen...

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Published inIEEE sensors journal Vol. 22; no. 15; pp. 15410 - 15418
Main Authors Rivera Velazquez, Josue Manuel, Latorre, Laurent, Mailly, Frederick, Nouet, Pascal
Format Journal Article
LanguageEnglish
Published New York IEEE 01.08.2022
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Institute of Electrical and Electronics Engineers
Subjects
Online AccessGet full text
ISSN1530-437X
1558-1748
DOI10.1109/JSEN.2022.3186636

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Abstract Low cost and small size integrated sensors bring a significant interest to redundant sensing systems such as sensor array systems. Redundancy may permit to increase both performance and dependability of individual sensors at the system level, however, the emergence of these redundant systems has generated the need for dynamic algorithms able to detect and act against the presence of errors in system elements. Then, a new adaptive algorithm for sensor array systems is presented in this work. This approach is generic and can be implemented for different types of sensor systems, besides it does not require any information about the inputs. The proposed real-time algorithm is based on the following: 1) estimation of sensor individual variances at each time step, 2) identification and removal of sensors affected by errors, and 3) reincorporation of sensors after recovery or replacement. Variance estimation is revisiting MInimum Norm Quadratic Unbiased Estimation (MINQUE) method to allow real-time operation and requires that the number of sensors is strictly greater than two times the number of signals to be measured. Consequently, the proposed method is able to support the presence of m-1 faulty devices, where m is the total number of sensors less two times the number of measured signals. Performance of the proposed algorithm is demonstrated through theoretical demonstrations, simulations, and experimental results.
AbstractList Low cost and small size integrated sensors bring a significant interest to redundant sensing systems such as sensor array systems. Redundancy may permit to increase both performance and dependability of individual sensors at the system level, however, the emergence of these redundant systems has generated the need for dynamic algorithms able to detect and act against the presence of errors in system elements. Then, a new adaptive algorithm for sensor array systems is presented in this work. This approach is generic and can be implemented for different types of sensor systems, besides it does not require any information about the inputs. The proposed real-time algorithm is based on the following: 1) estimation of sensor individual variances at each time step, 2) identification and removal of sensors affected by errors, and 3) reincorporation of sensors after recovery or replacement. Variance estimation is revisiting MInimum Norm Quadratic Unbiased Estimation (MINQUE) method to allow real-time operation and requires that the number of sensors is strictly greater than two times the number of signals to be measured. Consequently, the proposed method is able to support the presence of m-1 faulty devices, where m is the total number of sensors less two times the number of measured signals. Performance of the proposed algorithm is demonstrated through theoretical demonstrations, simulations, and experimental results.
Author Mailly, Frederick
Latorre, Laurent
Rivera Velazquez, Josue Manuel
Nouet, Pascal
Author_xml – sequence: 1
  givenname: Josue Manuel
  orcidid: 0000-0002-1529-3016
  surname: Rivera Velazquez
  fullname: Rivera Velazquez, Josue Manuel
  email: josue.rivera.velazquez@lirmm.fr
  organization: Laboratory of Informatics, Robotics and Microelectronics (LIRMM), University of Montpellier, Montpellier, France
– sequence: 2
  givenname: Laurent
  surname: Latorre
  fullname: Latorre, Laurent
  email: laurent.latorre@umontpellier.fr
  organization: Laboratory of Informatics, Robotics and Microelectronics (LIRMM), University of Montpellier, Montpellier, France
– sequence: 3
  givenname: Frederick
  surname: Mailly
  fullname: Mailly, Frederick
  email: frederick.mailly@lirmm.fr
  organization: Laboratory of Informatics, Robotics and Microelectronics (LIRMM), University of Montpellier, Montpellier, France
– sequence: 4
  givenname: Pascal
  orcidid: 0000-0003-2137-2623
  surname: Nouet
  fullname: Nouet, Pascal
  email: pascal.nouet@lirmm.fr
  organization: Laboratory of Informatics, Robotics and Microelectronics (LIRMM), University of Montpellier, Montpellier, France
BackLink https://hal-lirmm.ccsd.cnrs.fr/lirmm-03721575$$DView record in HAL
BookMark eNp9kctO3DAUQK2KSgXKB6BuLHVZZfAjiZ3lFA0vjajEDIidZcc3xSixqe1pNX9PwqBZsOjKXpxzr3V8hA588IDQKSUzSklzdrNa3M4YYWzGqaxrXn9Ch7SqZEFFKQ-mOydFycXjF3SU0jMhtBGVOETdHN_CPzzvf4fo8tOAuxDxhd70Ga9DD1H7FrDz-A7sxlvtM16BTyOz2qYMQ8I_dQKLw0Tovli7AfCDju7NW6TsBp1d8F_R5073CU7ez2N0f7FYn18Vy1-X1-fzZdGyqskFt4bbUhhpTW1pa5ikumyJrispLZhOmJI0wIgVZSO5Bgsdk4IJIwyhzGh-jH7s5j7pXr3EcXvcqqCdupovVe_iMCjCBaOVqP7Skf6-o19i-LOBlNVz2EQ_PlCxeuxT81LWI0V3VBtDShG6_WBK1BRfTfHVFF-9xx8d8cFpXX4rkaN2_X_NbzvTAcB-UyNpNf4ZfwWRgZN0
CODEN ISJEAZ
CitedBy_id crossref_primary_10_3390_s24124007
crossref_primary_10_1109_JSEN_2022_3229475
crossref_primary_10_17979_ja_cea_2024_45_10941
crossref_primary_10_1109_JSEN_2025_3536806
crossref_primary_10_1109_TCE_2023_3328607
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ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2022
Distributed under a Creative Commons Attribution 4.0 International License
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2022
– notice: Distributed under a Creative Commons Attribution 4.0 International License
DBID 97E
RIA
RIE
AAYXX
CITATION
7SP
7U5
8FD
L7M
1XC
DOI 10.1109/JSEN.2022.3186636
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005–Present
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Electronics & Communications Abstracts
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
Hyper Article en Ligne (HAL)
DatabaseTitle CrossRef
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
DatabaseTitleList

Solid State and Superconductivity Abstracts
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Geography
Engineering
EISSN 1558-1748
EndPage 15418
ExternalDocumentID oai:HAL:lirmm-03721575v1
10_1109_JSEN_2022_3186636
9815001
Genre orig-research
GrantInformation_xml – fundername: National Council of Science and Technology in Mexico (CONACYT)
GroupedDBID -~X
0R~
29I
4.4
5GY
6IK
97E
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFO
ACGFS
ACIWK
AENEX
AGQYO
AHBIQ
AJQPL
AKJIK
AKQYR
ALMA_UNASSIGNED_HOLDINGS
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
EBS
F5P
HZ~
IFIPE
IPLJI
JAVBF
LAI
M43
O9-
OCL
P2P
RIA
RIE
RNS
TWZ
AAYXX
CITATION
7SP
7U5
8FD
L7M
1XC
5VS
AETIX
AGSQL
AIBXA
EJD
H~9
ZY4
ID FETCH-LOGICAL-c259t-3db3d47b8db6d1cb281a4c0a6588debf7b409e20d74983aedef28727b7b012ba3
IEDL.DBID RIE
ISSN 1530-437X
IngestDate Tue Oct 14 20:44:20 EDT 2025
Mon Jun 30 10:14:04 EDT 2025
Thu Apr 24 23:07:28 EDT 2025
Wed Oct 01 05:05:49 EDT 2025
Wed Aug 27 02:23:36 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 15
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
https://doi.org/10.15223/policy-029
https://doi.org/10.15223/policy-037
Distributed under a Creative Commons Attribution 4.0 International License: http://creativecommons.org/licenses/by/4.0
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c259t-3db3d47b8db6d1cb281a4c0a6588debf7b409e20d74983aedef28727b7b012ba3
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ORCID 0000-0002-1529-3016
0000-0003-2137-2623
0000-0002-4030-0505
0000-0003-0478-1572
PQID 2697563486
PQPubID 75733
PageCount 9
ParticipantIDs crossref_primary_10_1109_JSEN_2022_3186636
hal_primary_oai_HAL_lirmm_03721575v1
proquest_journals_2697563486
crossref_citationtrail_10_1109_JSEN_2022_3186636
ieee_primary_9815001
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2022-08-01
PublicationDateYYYYMMDD 2022-08-01
PublicationDate_xml – month: 08
  year: 2022
  text: 2022-08-01
  day: 01
PublicationDecade 2020
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE sensors journal
PublicationTitleAbbrev JSEN
PublicationYear 2022
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Institute of Electrical and Electronics Engineers
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
– name: Institute of Electrical and Electronics Engineers
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SSID ssj0019757
Score 2.385454
Snippet Low cost and small size integrated sensors bring a significant interest to redundant sensing systems such as sensor array systems. Redundancy may permit to...
SourceID hal
proquest
crossref
ieee
SourceType Open Access Repository
Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 15410
SubjectTerms Accelerometers
Adaptive algorithms
Algorithms
data fusion
Engineering Sciences
Errors
Estimation
fault detection
Fault tolerance
homogeneous systems
Kalman filter
Micro and nanotechnologies
Microelectronics
MINQUE
Real time operation
Real-time systems
Redundancy
sensor array system
Sensor arrays
Sensor systems
Sensors
Variance estimation
weighted average
Title A New Algorithm for Fault Tolerance in Redundant Sensor Systems Based on Real-Time Variance Estimation
URI https://ieeexplore.ieee.org/document/9815001
https://www.proquest.com/docview/2697563486
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03721575
Volume 22
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVIEE
  databaseName: IEEE Electronic Library (IEL)
  customDbUrl:
  eissn: 1558-1748
  dateEnd: 99991231
  omitProxy: false
  ssIdentifier: ssj0019757
  issn: 1530-437X
  databaseCode: RIE
  dateStart: 20010101
  isFulltext: true
  titleUrlDefault: https://ieeexplore.ieee.org/
  providerName: IEEE
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3NT9swFH8CLmMHYMBE-ZIPnCZSktjEzrGgVhUaHMaHerPs2KEVaYNKOmn76_ecuBEDNO3Ww7Ni6ffs9_vV7wPgxKTGGAy0QY7xNWCRVoEwNgxCpTkT6lwJ6gqFr2-S4T27Gp2PVuC0rYWx1tbJZ7brftZv-abMFu6vsrNUIH1xxVqrXCRNrVb7YpDyuqsnHmD8JOUj_4IZhenZ1W3_BpVgHKNAFRhhk79i0OrYZUDWo1Xe3cd1kBlswvVye01uyVN3Uelu9vtN58b_3f8WbHi2SXqNe3yBFTvbhs-vehBuwyc_Bn38awfyHsFLj_SKx3I-qcZTgoyWDNSiqMhdWVg3g8OSyYz8sK72DDEht6iC0cb3PScXGBMNKZ2FKgJXXkIeUIzX6_p4mTR1krtwP-jfXQ4DP4ghyFAdVQE1mhrGtTA6MVGmYxEploUK2QsCq3OuUSXaODScpYIqa2yOQizmmmuMf1rRr7A2K2d2D4jCA6-RZuRRzlhqczRw_WkyjsxOWao7EC6hkZnvUu6GZRSyVithKh2a0qEpPZod-NYueW5adPzL-ATxbu1cc-1h77ssJvPpVIYU9TDy159RB3YcfK2dR64Dh0sHkf6sv8g4Qd9LKBPJ_serDmDdbaFJGzyEtWq-sEdIZSp9XPvwH5sc7oo
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3Pb9MwFH4a4zA48GMDUbaBDzsh0iWxGzvHDrUqo-2Bdag3y46dtSJtpi5Fgr-e58SNxg8hbjk8K46-Z7_3xX7fAzgzqTEGA22QY3wNWKRVIIwNg1BpzoTqKUFdofBkmoyu2eW8N9-D920tjLW2vnxmu-6xPss3ZbZ1v8rOU4HpiyvWethjjPWaaq32zCDlta4nLmF8KeVzf4YZhen55dVgilwwjpGiCoyxyS9R6MHC3YGsm6v8sSPXYWb4FCa7CTa3S752t5XuZj9-02783y94Bk98vkn6jYM8hz27PoTH91QID-HAN0JffD-CvE9w2yP94qbcLKvFimBOS4ZqW1RkVhbWdeGwZLkmn62rPkNUyBXyYLTxyufkAqOiIaWzUEXgCkzIF6Tj9bgBbidNpeQLuB4OZh9GgW_FEGTIj6qAGk0N41oYnZgo07GIFMtChfkLQqtzrpEn2jg0nKWCKmtsjlQs5pprjIBa0Zewvy7X9hUQhUteY6KRRzljqc3RwCnUZBxzO2Wp7kC4g0ZmXqfctcsoZM1XwlQ6NKVDU3o0O_CuHXLbiHT8y_gM8W7tnLz2qD-WxXKzWsmQIiPGDPZb1IEjB19r55HrwMnOQaRf7XcyTtD3EspE8vrvo97CwWg2Gcvxx-mnY3jkptNcIjyB_WqztaeY2FT6Te3PPwE-WPHX
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=A+new+algorithm+for+fault+tolerance+in+redundant+sensor+systems+based+on+real-time+variance+estimation&rft.jtitle=IEEE+sensors+journal&rft.au=Rivera+Vel%C3%A1zquez%2C+Josu%C3%A9+Manuel&rft.au=Latorre%2C+Laurent&rft.au=Mailly%2C+Fr%C3%A9d%C3%A9rick&rft.au=Nouet%2C+Pascal&rft.date=2022-08-01&rft.pub=Institute+of+Electrical+and+Electronics+Engineers&rft.issn=1530-437X&rft.volume=22&rft.issue=15&rft.spage=15410&rft.epage=15418&rft_id=info:doi/10.1109%2FJSEN.2022.3186636&rft.externalDBID=HAS_PDF_LINK&rft.externalDocID=oai%3AHAL%3Alirmm-03721575v1
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1530-437X&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1530-437X&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1530-437X&client=summon