Wang, J., Chen, S., Wang, X., Deng, Z., Wang, C., & Li, J. (2025). 3D localization for light-field microscopy via convergent accelerated inertial algorithm. Expert systems with applications, 291, 127494. https://doi.org/10.1016/j.eswa.2025.127494
Chicago Style (17th ed.) CitationWang, Jinjia, Shixue Chen, Xiaofan Wang, Zhiyuan Deng, Changle Wang, and Jing Li. "3D Localization for Light-field Microscopy via Convergent Accelerated Inertial Algorithm." Expert Systems with Applications 291 (2025): 127494. https://doi.org/10.1016/j.eswa.2025.127494.
MLA (9th ed.) CitationWang, Jinjia, et al. "3D Localization for Light-field Microscopy via Convergent Accelerated Inertial Algorithm." Expert Systems with Applications, vol. 291, 2025, p. 127494, https://doi.org/10.1016/j.eswa.2025.127494.