APA (7th ed.) Citation

Li, T., Cai, Z., Zeng, Z., Zhang, Z., & Si, X. (2025). Remaining useful life prediction for stochastic deteriorating Devices: A direct approach via inverse degradation modeling. Mechanical systems and signal processing, 228, 112431. https://doi.org/10.1016/j.ymssp.2025.112431

Chicago Style (17th ed.) Citation

Li, Tianmei, Zhenyu Cai, Zhaoju Zeng, Zhengxin Zhang, and Xiaosheng Si. "Remaining Useful Life Prediction for Stochastic Deteriorating Devices: A Direct Approach via Inverse Degradation Modeling." Mechanical Systems and Signal Processing 228 (2025): 112431. https://doi.org/10.1016/j.ymssp.2025.112431.

MLA (9th ed.) Citation

Li, Tianmei, et al. "Remaining Useful Life Prediction for Stochastic Deteriorating Devices: A Direct Approach via Inverse Degradation Modeling." Mechanical Systems and Signal Processing, vol. 228, 2025, p. 112431, https://doi.org/10.1016/j.ymssp.2025.112431.