Kang, H., Kim, Y., Kim, M., & Lee, S. (2025). Numerical Analysis of Partial Discharge With Lossy Multi-Dielectric Insulator Forming Migration-Ohmic Model. IEEE transactions on magnetics, 61(1), 1-4. https://doi.org/10.1109/TMAG.2024.3498946
Chicago Style (17th ed.) CitationKang, Hyemin, Yonghee Kim, Minhee Kim, and Se-Hee Lee. "Numerical Analysis of Partial Discharge With Lossy Multi-Dielectric Insulator Forming Migration-Ohmic Model." IEEE Transactions on Magnetics 61, no. 1 (2025): 1-4. https://doi.org/10.1109/TMAG.2024.3498946.
MLA (9th ed.) CitationKang, Hyemin, et al. "Numerical Analysis of Partial Discharge With Lossy Multi-Dielectric Insulator Forming Migration-Ohmic Model." IEEE Transactions on Magnetics, vol. 61, no. 1, 2025, pp. 1-4, https://doi.org/10.1109/TMAG.2024.3498946.