Study of the tip mass and interaction force effects on the frequency response and mode shapes of the AFM cantilever - Farrokh Payam, Amir; Fathipour, M. (International journal of advanced manufacturing technology, 2013)
Keywords: Atomic force microscopes; Atomic force microscopy; CAE) and Design; Cantilever beams; Computer-Aided Engineering (CAD; Engineering; Euler-Bernoulli method; Frequency response; Industrial and Production Engineering; Mechanical Engineering; Media Management; Microscopes; Numerical analysis; Original Article; Q factors; Shape effects; Spring constant; Mode shape; Interaction force; Tip mass; Cantilever; Resonance frequencies