Li, X., Duan, C., Cai, J., Zuo, H., Liu, Z., & Liu, Y. (2024). Remaining Useful Life Prediction of IIoT Equipment Using Hidden Semi-Markov Model With Hyper-Erlang Sojourn Time. IEEE internet of things journal, 11(19), 31010-31027. https://doi.org/10.1109/JIOT.2024.3415745
Chicago Style (17th ed.) CitationLi, Xin, Chaoqun Duan, Jing Cai, Hongfu Zuo, Zhenzhen Liu, and Yan Liu. "Remaining Useful Life Prediction of IIoT Equipment Using Hidden Semi-Markov Model With Hyper-Erlang Sojourn Time." IEEE Internet of Things Journal 11, no. 19 (2024): 31010-31027. https://doi.org/10.1109/JIOT.2024.3415745.
MLA (9th ed.) CitationLi, Xin, et al. "Remaining Useful Life Prediction of IIoT Equipment Using Hidden Semi-Markov Model With Hyper-Erlang Sojourn Time." IEEE Internet of Things Journal, vol. 11, no. 19, 2024, pp. 31010-31027, https://doi.org/10.1109/JIOT.2024.3415745.