EF-CIM: An Endurance Friendly CIM Accelerator Using Embedded NVM With Bit-Aware Wear Leveling for Efficient Light-Weight On-Chip Training in Edge Devices - Guo, Zhiwang; Jiang, Jingwen; Chen, Deyang; Fang, Jinbei; Yang, Jianguo; Han, Jun; Xue, Xiaoyong; Zeng, Xiaoyang (IEEE transactions on circuits and systems. I, Regular papers, 2025)
Keywords: Accelerators; Artificial intelligence; Artificial neural networks; Back propagation networks; bit-aware wear leveling; Computation; computing-in-memory; edge devices; Embedded nonvolatile memory; endurance; Energy efficiency; In-memory computing; Kernel; Leveling; Memory devices; Nonvolatile memory; on-chip training; Performance evaluation; Phase change random access memory; Random access memory; Switches; System-on-chip; Training