A Vectorial Current Density Visual Inspection Method for IGBT Modules - Wu, Yangjing; Li, Hangcheng; He, Yichen; Li, Jing; Su, Huiyi; Shi, Chengyu; Zhang, Wenwei; Zhang, Mingji (IEEE transactions on electron devices, 2024)
Keywords: Circuit faults; Circuit health prognostics; Current density; current density imaging; Divergence; Electric power systems; Electric vehicles; Finite element method; Fluxgate magnetometers; Input impedance; Inspection; insulated gate bipolar transistor (IGBT) modules; Insulated gate bipolar transistors; Magnetic field measurement; Magnetic fields; Magnetic resonance imaging; Modules; nondestructive testing; Overcurrent; Position measurement; Power semiconductor devices; Short circuits; Visual fields